X-ray system
Staff -- Test & Measurement World, 9/1/2006 2:00:00 AM
Comet has enhanced its FeinFocus µCT-FOX series of x-ray inspection systems with the introduction of the FeinFocus HDCT-FOX. The system combines high-resolution 2-D x-ray technology with 3-D computed tomography (CT) techniques for inspecting and analyzing complex electronic devices.
According to the manufacturer, the HDCT-FOX is ideal for applications requiring high magnification, such as inspection of MEMS/MOEMS, semiconductor packages, high-density interconnects, and hybrids. The system captures high-resolution 2-D images and reconstructs 3-D volume models, providing insight into design and manufacturing processes. A modular hardware- and software-based CT interface accommodates a variety of imaging chains, with automatic configuration of the detector for optimal CT resolution.
The FeinFocus HDCT-FOX is designed for integration with the iView technology developed by TeraRecon, allowing instantaneous uploading of sets of 3-D images to a secure Web site. This feature allows failure-analysis labs to transmit 2-D and CT imagery using a high-speed Internet connection, so the x-ray scanning process can be centralized while the image analysis is decentralized.
Comet, www.comet.ch.
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