ITC: CAST established as test products debut
International Test Conference, October 28–30, Santa Clara, CA, www.itctestweek.org.
-- Test & Measurement World, 12/1/2008 2:00:00 AM
At this year's ITC, representatives of nine companies—Advantest, Amkor, Infineon, Intel, LTX-Credence, Qualcomm, Roos Instruments, Teradyne, and Verigy—came together under the CAST banner in an effort to foster precompetitive collaboration. CAST, which stands for Collaborative Alliance for Semiconductor Test, will work to resolve common industry issues with the goal of achieving higher equipment utilization, easier line balancing, and greater return on investment for equipment users.
Goepel electronic introduced the SFX-9305 I/O module as a new addition to the ScanFlex hardware platform. The company also announced extended JTAG functionality for the SPEA 4040 flying prober. Asset InterTech said it has joined Synopsys's in-Sync program for third-party suppliers of EDA-related products. Asset also highlighted its RIC (Remote Instrumentation Controller) family.
Cadence Design Systems said Hitachi has combined Encounter Test pattern-fault modeling with test pattern generation, compression, and diagnostics to produce LSI devices for telecommunications and other applications. Cadence also said that Moai Electronics has deployed Cadence Encounter RTL Compiler and Encounter Test to successfully tape-out a flash memory controller. Representatives of JTAG Technologies and Teseda were on hand to describe separate initiatives in conjunction with Teradyne that involved TestStation boundary-scan integration and silicon debug, respectively.
OptimalTest said that it has signed an agreement with STATS ChipPAC to provide OptimalTest's Station Controller software as a test-management tool. Intellitech introduced its UltraTAP-BT, a Bluetooth-enabled IEEE 1149.1/JTAG pod with nonvolatile test program and failure memory.
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