Advantest's T5385 DRAM wafer test system offers 768-DUT parallel test capacity
-- Test & Measurement World, 7/30/2009 9:37:00 AM
Advantest has announced the availability of its new T5385 memory test system for DRAM (dynamic random access memory) wafer test, offering a parallel test capability of 768 devices—which the firm says is the highest in the industry, offering twice the capability of the company’s previous model.
Demands at wafer-level test continue to increase for improved performance and a lowered cost-of-test, Advantest reports, noting that the new T5385 addresses these issues and improves efficiency per device while scaling even higher in parallelism. The T5385 offers, in addition to its 768-DUT parallel test capacity, the ability to deliver 533-Mbps capability. The new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, and it allows tester pin resources to be optimally allocated for efficiency, reduced touchdowns, and improved throughput. The T5385 also delivers KFD (known good die) for consumer devices, to improve yields for emerging LPDDR2 (low-power DDR2) and DDR3 multi-die and stacked devices. The T5385 offers a high-speed MRA (memory repair analysis) system for DRAM and flash memory wafer test that greatly reduces test time.
www.advantest.com
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