Suss adds 1MX technology to |Z| Probe line
-- Test & Measurement World, 9/1/2009 2:00:00 AM
Suss MicroTec has announced its new 1MX probe technology for the company’s |Z| Probe product line. The 1MX technology retains the |Z| Probe product line’s contact quality while providing a higher bandwidth, lower insertion loss, and higher isolation. Insertion loss, for example, is less than 0.8 dB at 67 GHz, and contact isolation is better than 40 dB.
The probes are optimized for 50- to 250-µm pitch. They come with a smaller contact footprint than standard |Z| Probe types to enable fine-pitch testing with less overtravel while maintaining a life span of 1 million touchdowns. The 1MX |Z| Probes are available in frequency ranges including 20, 40, 50, and 67 GHz and in GSG (ground-signal-ground), GS, SG, SGS, GSSG, and GSGSG footprint configurations. They are available in cryo (down to 10 K) and high-temperature (up to 300°C) versions.
Suss MicroTec Test Systems, www.suss.com.
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