Agilent Technologies launches Medalist i3070 Series 5 in-circuit test series
The Series 5 ICT system offers new analog measurement technology together with a 12-MHz hybrid pin card.
-- Test & Measurement World, 8/28/2009 2:21:00 PM
Agilent Technologies has introduced the Medalist i3070 Series 5 in-circuit test (ICT) platform, marking 20 years since the company launched the first members of the 3070 ICT family.
The Series 5 ICT system offers new analog measurement technology together with a 12-MHz hybrid pin card, giving electronic manufacturers 20 to 30% throughput improvement over the current i3070 at the same list prices. The Series 5 ICT system also offers new infrastructure that allows manufacturers to incorporate external circuits easily for added test coverage while providing better control of those circuits. Instead of having multiple sets of external circuits in multiple fixtures, manufacturers can now put the external circuits in the test head. Agilent reports it has identified partners to provide high-speed flash programming, LED testing, and boundary-scan testing via these external circuits.
Current users of i3070 and 3070 PC systems can run most of their ICT programs seamlessly on the new Series 5 tester. Fixtures built since the introduction of the 3070 remain compatible.
"Cost of test is a critical challenge for our customers," said Daniel Mak, VP and GM of Agilent's Measurement Systems Division. "The i3070 Series 5 enables reduction in cost of test without sacrificing any coverage. With a 20 to 30% ICT throughput improvement, customers can improve test efficiencies enabled by the new and improved source measurement engine in the Series 5 ICT system. And the addition of external circuits removes expensive test steps from their test processes."
The Series 5 ICT system addresses an array of in-circuit and functional test needs, including IEEE1149.6 boundary-scan standard testing and limited-access test applications for highly complex and small-footprint boards in sophisticated consumer electronics, data communication, automotive, aerospace and defense and medical applications. The test system has been able to test low-voltage components reliably since the introduction of the 3070.
www.agilent.com
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