Highlights
-- Test & Measurement World, 10/1/2009 2:00:00 AM
StockerYale improves line-scan illuminator
Ten times brighter than StockerYale’s standard line-scan illuminator, the Cobra Slim comes with white LED illuminators and offers line-scan illumination in excess of 4 million lux. The illuminator covers wavelengths from 360 nm to 1550 nm and ensures a high level of uniformity thanks to its chip-on-board LED module fabrication, which yields an essentially unbroken line of semiconductor light. Intensity control and temperature monitoring are available through an optional Ethernet interface. www.stockeryale.com.
AOI system inspects larger boards
You can now use the OptiCon SmartLine, a desktop AOI system from Goepel, for inspecting printed-circuit boards up to 400x390 mm in size. Intended for small-volume manufacturing, the Opticon SmartLine, which includes an integrated PC, serves as an offline test station or repair station.
At the core of the system is a camera-based imaging unit that employs a custom telecentric lens, along with an illumination system that consists of three basic modules that deliver multicolored and multidirectional illumination.
The company’s Extended Color Technology enables both high-contrast gray-scale and high-resolution color imaging. Since the PC is completely integrated into the main chassis, only a monitor and keyboard are needed to begin inspection work. www.goepel.com.
Smart cameras offer right-angle housing
Joining the Impact family of smart cameras from PPT Vision is the right-angle T-Series, which offers both in-line and remote-head housings to permit greater flexibility in camera positioning. Teamed with the company’s Impact software, the T-Series can be used for applications such as automated inspection and optical character recognition.
With its high-speed 1600-MIPS processor, the T-Series right-angle camera performs inspections at a rate of up to 6000 ppm. Six right-angle models are available, including color, gray-scale, and 1600x1200-pixel resolution options. www.pptvision.com.
MEMS inspection system works alone or in-line
Vi Technology has introduced the Reveal MEMS AOI equipment for semiconductor applications. The company says the Reveal is able to detect various sizes of foreign materials or scratches, and the system can also measure die positioning, rotation, tilt, and other parameters when required.
The new system features high-accuracy axes and an optical acquisition system with a submicron pixel size. It detects foreign materials, such as silicon, alumina, or human-related particles, in sizes larger than 3 µm. At the same time, the equipment inspects the structure integrity of the MEMS die by checking missing or damaged beams or wires as well as the position of the die (x, y, and rotation) within the package.
The Reveal MEMS can be used as a stand-alone system for small production batches, or it can be integrated with customized handling equipment for use as an in-line system. Vi Technology says it can be adapted to any product type and size as well as to any carrier, such as wafers, boats, trays, or strips. www.vitechnology.com.
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