T&MW's Top Articles of September 2009
-- Test & Measurement World, 10/15/2009 9:44:10 AM
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The following articles that were originally published in Test & Measurement World were the most frequently visited on our Web site in September.
What does GT/s mean, anyway?
Version
2.0 of the PCI Express standard "doubles the interconnect bit rate from
2.5 GT/s to 5 GT/s." Most of us are used to seeing bus speeds specified
in Gbps, or gigabits per second, but GT/s stands for gigatransfers per
second. What's the difference? Read More
How does a Smith chart work?
The
Smith chart appeared in 1939 as a graph-based method of simplifying the
complex math (that is, calculations involving variables of the form x +
jy) needed to describe the characteristics of microwave components. Read More
GM's meaningless 230-mpg spec for Volt
General Motors seems intent to focus on marketing hocus-pocus rather
than trying to build and sell better cars. The latest is the outlandish
claim that the Chevy Volt will get 230 mpg. Read More
Linux works for test
As assistant manager of test engineering at Tejas Networks, Anshul Jain
is responsible for all test-engineering development, quality-assurance
testing, and final deployment of Linux-based test systems for
manufacturing. Read More
Test system upgrades can expose problems
When you upgrade a legacy test system, be prepared to uncover new
problems or to revisit problems for which you found a workaround in the
past. Read More
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These Web-exclusive articles were also among the most-viewed pages in September:
2009 Career & Salary Survey
Check
out the results of our 2009 Career & Salary Survey to learn how
your salary and benefits compare to those of your peers. Read More
NIST updates guide to radio-controlled clocks
The updated guide includes revised rules for Daylight Saving Time and corrections to time zone tables. Read More
Danaher speeds up restructuring, acquires life-sciences businesses
Danaher, the parent company of test-and-measurement companies including
Fluke and Tektronix, announced today that it plans to accelerate its
2009 restructuring activities. The company also said it would acquire
the life sciences instrumentation businesses from MDS Inc. and Life
Technologies. Read More
3-D chips, outreach to designers among highlights planned for 2009 International Test Conference
Boundary scan, testing of 3-D chips, yield vs. quality, and outreach to
the design community will be among items on the agenda at the 40th
International Test Conference, scheduled for November.
Read More
White paper examines RapidIO interoperability testing
The RapidIO Trade Association, together with Fabric Embedded Tools
(FET), has released a white paper, which identifies three key
implementation challenges that often affect device interoperability. Read More
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Plus, these were the most-read blogs in September:
Germans stock up on incandescent lamps, American trashes CFLs
Award-winning test engineer's firm gets CE approval for Parkinson's treatment
Whatever happened to analog BIST?
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