Mentor Graphics combines test and yield analysis in Tessent line
The new Tessent product line will combine ATPG, test-vector compression, logic and memory BIST, and failure-diagnosis and statistical-analysis tools.
By Ron Wilson, Executive Editor, EDN -- Test & Measurement World, 11/2/2009 12:26:00 PM
Mentor Graphics has announced the Tessent product line, under which the company will integrate its portfolio of test and yield-analysis products and connect them into a single platform. The products will include Mentor's own FastScan ATPG (automatic test-pattern generation) and TestKompress test-vector compression tools, test tools acquired with Mentor's acquisition of NXP's test group in May of last year, logic and memory BIST (built-in self test) tools acquired with the purchase of LogicVision in August of this year, and a new set of failure-diagnosis and statistical-analysis tools.
Under the Tessent brand, Mentor specifically unveiled Tessent Diagnosis and Tessent YieldInsight. Tessent Diagnosis is a data-correlating tool that fuses test data from both BIST and ATE (automated test equipment) sources with the design database so designers can view fault data on routing or die maps. YieldInsight, in contrast, is a statistical package. According to Joe Sawicki, Mentor's VP and GM for Design-to-Silicon, YieldInsight offers automated analysis and presentation routines for Pareto, zonal, and wafer-map plots, among others.
See "Mentor assembles a test-yield fusion platform" on EDN.com for more.
Going beyond design for test (continued)
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