Cyber Technologies hones accuracy of surface-metrology systems
The CT series provides fast, accurate measurement of most surface topologies.
-- Test & Measurement World, 11/11/2009 7:00:00 AM
Noncontact optical 3-D surface-metrology systems in the CyberScan CT series from Cyber Technologies enable precise measurement with a resolution down to 3 nm. According to the manufacturer, the CT series provides fast, accurate measurement of most surface topologies or optical film thickness on conformal coatings and other materials (wet or dry).
High-speed linear XY scanning stages in 100-mm, 200-mm, and 300-mm sizes combine with an integrated laser, white light, or interferometric sensors to support process control in production environments, fast 3-D sample scans, preprogrammed test patterns, or individual R&D measurements. New sensor technology enhances the system's capability to measure transparent or highly reflecting surfaces.
You can use the CT series to replace slow stylus-based profilometers in a majority of applications and conduct measurements without contacting or potentially damaging the measurement object or its surface—at scan speeds an order of magnitude faster. Systems offer surface-metrology analysis and automated measurement routines for most any topography. With the ASCAN software suite, you can perform go/no-go tests and obtain SPC (statistical process control) and Cpk (process capability) results.
Cyber Technologies, www.cybertechnologies.com.
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