T&MW's Top Articles of October 2009
-- Test & Measurement World, 11/11/2009 3:39:30 PM
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The following articles that were originally published in Test & Measurement World were the most frequently visited on our Web site in October.
What does GT/s mean, anyway?
Version
2.0 of the PCI Express standard "doubles the interconnect bit rate from
2.5 GT/s to 5 GT/s." Most of us are used to seeing bus speeds specified
in Gbps, or gigabits per second, but GT/s stands for gigatransfers per
second. What's the difference? Read More
How does a Smith chart work?
The
Smith chart appeared in 1939 as a graph-based method of simplifying the
complex math (that is, calculations involving variables of the form x +
jy) needed to describe the characteristics of microwave components. Read More
The technical divide
There seems to be a gap between senior engineers (over age 45) and junior engineers (28 and under) that is wider than just the difference in age. Read More
Testing the tester components
Engineers at Peregrine Semiconductor have developed unique measurement approaches to test the firm's line of RF switches, whose performance might surpass that of the test equipment in which they might ultimately find use. Read More
What are S-parameters, anyway?
Elementary circuit theory provides many methods for describing electronic networks. Read More
Analog cameras still play a role
Although digital cameras continue to make inroads in machine vision, the use of analog cameras is not declining as quickly as some predicted when digital technology first became available. Read More
Divide and conquer signal anomalies
Real-time oscilloscopes digitize signals and store them in memory before processing and displaying waveforms. Knowing how to most effectively allocate that memory can help you get to the root cause of signal problems more quickly. Read More
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Top Web-Exclusive Articles
These Web-exclusive articles were also among the most-viewed pages in October:
2009 Career & Salary Survey
Check
out the results of our 2009 Career & Salary Survey to learn how
your salary and benefits compare to those of your peers. Read More
ITC 2009: BIST to give way to built-in self-everything as 3-D chips emerge
Are fundamental changes needed in test? That's a question sure to stir controversy at the 40th International Test Conference, scheduled for November 3-5 in Austin, TX. Read More
Teradyne partners with Teseda to provide scan diagnosis tool
Teradyne has announced the signing of an exclusive development agreement with Teseda to produce Scan Workbench, a portable scan debug and yield-enhancement tool. Read More
LTX-Credence touts production-test architecture, chip firms report success with NI characterization tools
Semiconductor test has been grabbing the attention of test vendors on divergent sides of the test-equipment spectrum. LTX-Credence has announced a new IMA, while NI is reporting successful application of its PXI hardware and virtual-instrument software in semiconductor projects. Read More
CISPR standard up for a vote
The international EMC standard CISPR 16-1-1 Ed. 3 preview is now available. If approved, the standard for will allow EMI engineers to make compliance measurements below 1 GHz with a spectrum analyzer that lacks a preselector. Read More
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Top Blogs
Plus, these were the most-read blogs in October:
Weak economy, anti-immigrant sentiment hits H-1B visa program
Texas governor touts $160 million for STEM
T&MW's Top Articles for October 2008
11/14/2008T&MW's Top Articles of September 2009
10/08/2009T&MW's Top Articles of September 2009
10/15/2009T&MW's Top Articles of August
09/08/2009T&MW's Top Articles of November 2009
12/09/2009
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FLIR offers IR camera for under $3000
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Don't let the economy compromise quality (Guest commentary)
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Danaher speeds up restructuring, acquires life-sciences businesses
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Agilent’s Cover-Extend technology eliminates need for physical test points for in-circuit test
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So many combinations: Testing a switch-matrix board
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