Agilent introduces 12-GHz differential wafer probe tip
-- Test & Measurement World, 2/1/2010 2:00:00 AM
Agilent Technologies has introduced a 12-GHz differential wafer-probe tip that allows R&D and test engineers to use an oscilloscope to debug and test high-speed active ICs. The N2884A InfiniiMax differential fine-wire probe tip uses the company’s ZIF probe-head technology, which Agilent says provides a flat frequency response over the entire 12-GHz bandwidth specification. The tip also reportedly eliminates the distortion and loading that affect probes with in-band resonance.
The N2884A measures a voltage versus an adjacent local ground or other node on the device under test. Agilent says the technique delivers better common-mode noise rejection and signal integrity than techniques that measure a voltage versus a ground distant from the probe point.
The N2884A package includes a probe arm and a set of five probe tips. The probe arm is compatible with the Wentworth Laboratories micropositioner.
Price: $1800. Agilent Technologies, www.agilent.com.
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