Sunfilm employs Basler's in-line metrology equipment to inspect solar module

Sunfilm uses the equipment to inspect incoming glass and ensure the quality of the final product.

-- Test & Measurement World, 2/11/2010 7:00:00 AM

Sunfilm has integrated three Sensic in-line metrology systems from Basler Vision Technologies into its Applied Materials SunFab thin-film line for photovoltaic modules. Sunfilm uses the equipment to inspect incoming glass, to ensure the quality of the semiconductor coatings on thin-film modules, and to ensure the quality of the final product after the lamination process is finished.

Basler reports that its metrology systems have been successfully used for the LCD inspection for the last 10 years and have been adapted and optimized to the thin-film industry.

All three Basler Sensic inspection systems at Sunfilm are in-line-systems that were installed and put into operation with minimal downtime. The data exchange between the SunFab's factory-automation system and Basler's metrology system is realized via the standard industry protocol SECS/GEM, which allows an online and in-time data exchange.

"Sunfilm is again demonstrating its technological edge and commitment to constant innovation and latest state-of-the-art process control with the implementation of this new generation of inspection tools, developed together with Basler," says Dr. Wilhelm Stein, chief engineer at Sunfilm.

Sunfilm reports that it is the first Applied Materials customer using tandem junction thin-film silicon cell structure. This technology allows a larger part of the solar spectrum to be harvested as compared to amorphous silicon thin-film solar modules, leading to higher module efficiencies.

Basler Vision Technologies, www.baslerweb.com

Sunfilm, www.sunfilm.com