News Briefs
-- Test & Measurement World, 3/1/2010 12:00:00 AM
Keithley debuts ultra-fast current-voltage system
Keithley Instruments has introduced the Model 4225-PMU Ultra Fast I-V Module, an addition to its instrumentation options for the Model 4200-SCS semiconductor characterization system. The new module integrates ultra-fast voltage-waveform generation and current-and-voltage measurement capabilities into the Model 4200-SCS's test environment to deliver what Keithley says is the industry's broadest dynamic range of voltage, current, and rise, fall, and pulse times.
Lee Stauffer, marketing engineer at Keithley, said that to characterize and understand any device, material, or process fully, engineers need to make three types of measurements: precision DC I-V measurements (which Keithley's 4200-SMU accomplishes), AC impedance (which C-V instruments like the company's Model 4210-CVU can make), and ultra-fast I-V, or transient I-V, measurements. Stauffer said the Model 4225-PMU makes ultra-fast I-V sourcing and measurement as easy as making DC I-V measurements.
Keithley has also introduced the optional Model 4225-RPM remote amplifier/switch, which gives the 4225-PMU four additional low-current ranges, extending sensitivity down to tens of picoamps. The 4225-RPM can switch automatically among a 4225-PMU and C-V or DC source-measure instruments. Stauffer says the 4225-RPM can be located at Suss MicroTec and Cascade Microtech probers to make on-wafer measurements.
The Model 4225-PMU costs $19,000. A typical configuration of one Model 4225-PMU and two Model 4225-RPMs costs $25,000. The products will be available in May. www.keithley.com.
IEEE publishes 1149.7
In February, the IEEE published the IEEE 1149.7 test and debug standard, which complements the IEEE 1149.1 (JTAG) family of standards. Developed in an IEEE working group led by Texas Instruments, IEEE 1149.7 offers features and upgrades aimed at the test challenges posed by small consumer electronics. Such challenges include complex digital circuitry, multiple CPUs, and the size constraints imposed by small form factors. The six classes in the standard include IEEE 1149.1 extensions, ensuring compliance for chips with multiple TAPs.
According to the IEEE, the new and enhanced features include significantly decreased scan-chain lengths; well-defined power control functions, including four selectable power modes; support for two-pin operation, instruction, and custom pin usage; new test tools such as chip bypass and star topology testing; increased port efficiency; and background data transfers concurrent with advanced scan transactions.
“IEEE 1149.7 offers a flexible, dynamic solution for designers and engineers contending with shifting design paradigms without eroding the firm foundation established by earlier standards, such as IEEE 1149.1,” said Stephen Lau, emulation technology product manager at Texas Instruments, in a prepared statement. “The combination of an extraordinary level of customizability with already-proven technologies maximizes IEEE 1149.7's effectiveness, ensuring its role as an essential, cost-effective test and debug tool.” grouper.ieee.org/groups/1149/7.
Aeroflex debuts LTE simulator
To speed up real-world testing of mobile handsets for LTE networks ahead of network deployment later this year, Aeroflex has introduced a one-box test system, based on its 7100 Series radio test set, for cellphone signal-fading simulation. The company says its 7100 Series with a fading simulator software option provides fading simulation that meets or exceeds all 3GPP requirements and offers flexibility in the allocation cells and fading taps for LTE user equipment without the need for manual reconfiguration. The system's fully repeatable test scenarios include the emulation of dynamic environments and realistic and accurate testing of MIMO scenarios.
Targeting RF engineers, system integrators, and regression test engineers, the 7100 Series fading simulator supports all 3GPP fading profiles and also supports LTE bandwidths to 20 MHz with a frequency range up to 6 GHz.
Price: a typical system with two RF carriers and 2x2 MIMO—approximately $100,000; the fading simulator software option for units already in the field—$10,000. Aeroflex, www.aeroflex.com.
Connect sensors to the Internet
The Tag4M “sensor tag” is an 802.11b/g device for connecting sensors to the Internet. The Tag4M lets you create a sensor network that you can control online through a WiFi interface, and it uses RFID to provide an IP address so you can collect data.
To control the Tag4M, you can write an application in LabView or C++ to send commands to collect data, or you can subscribe to a service such as pachube.com to store data. Each sensor tag's 802.11b/g interface has a range of 50 m indoors and 100 m outdoors through its ceramic antenna. The Tag4M consumes 4 µA in sleep mode, 50 mA when receiving commands, and 210 mA when transmitting data.
Powered by a 3-V battery or an external 3.3–V source, the sensor tag has a 14-bit ADC with five analog inputs and four programmable digital I/O lines. It also has an onboard thermistor for measuring temperature. The analog input range is 0–10 V on one channel with three channels having a range of 0–0.4 V. A fifth channel can measure 4–20 mA of current. The sensor has an onboard shunt resistor for current measurement. It scans the channels at 3.3 Hz, and it can store 10 ksamples of 14-bit data.
Price: $124. Cores Electronic, www.tag4m.com.
Calendar
IPC APEX, April 6–9, Las Vegas, NV. IPC. www.goipcshows.org.
SAE World Congress, April 13–15, Detroit, MI. SAE International. www.sae.org.
International Microwave Symposium, May 23–28, Anaheim, CA. IEEE, www.ims2010.org.
The Vision Show, May 25–27, Boston, MA. Automated Imaging Association, www.machinevisiononline.org.
Sensors Expo, June 7–9, Rosemont, IL. Questex Media Group, www.sensorsexpo.com.
To learn about other conferences, courses, and calls for papers, visit www.tmworld.com/events.
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