"PXI Test Report" goes modular (Editor's note)

Starting with this issue, the "PXI Test Report" has been renamed the "Modular Instrumentation Test Report" and will cover all the modular instrument standards, including PXI, USB, LXI, VXI, AXIe, and their extensions.

Richard A. Quinnell, Contributing Technical Editor -- Test & Measurement World, 3/1/2011 12:00:00 AM

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Over the last decade, PXI has grown from a start-up into a major player in test instrumentation. The technology has continually expanded in range and scope, repeatedly proving the benefits of modular design for test. Thanks in large part to PXI, modular has become a well-established approach to test-instrument design, and this success has prompted the development of other modular standards, including LXI for box instruments and now AXIe for large-format boards. Agilent Technologies has recently underscored the importance of modular design by announcing a strategic push to integrate modular formats with its traditional box-instrument offerings.

Because of the growth of modular instrumentation, Test & Measurement World has expanded the range and scope of the "PXI Test Report." Starting with this issue, the report has been renamed the "Modular Instrumentation Test Report" and will cover all the modular instrument standards, including PXI, USB, LXI, VXI, AXIe, and their extensions. This broadened range of topics will allow us to cover both individual technologies and the interplays among them, and to guide you toward finding the right modular format for your test needs.

Let us know what you think. What topics in modular test do you want us to address? Send me your suggestions.

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Contact Richard A. Quinnell at richquinnell@att.net.