Product Round-Up:
Software for test and measurement applications

Recent software releases cover communications test, automotive test, and boundary-scan applications.

-- Test & Measurement World, 1/26/2012 2:25:15 PM

Looking for test software? Check out these recently released or updated software products that can aid you in your test, measurement, and inspection applications.


R&S drive-test software gains MIMO functions
Rohde & Schwarz has added MIMO-specific measurement functions to its ROMES4 drive-test software. Together with the company's TSMW network scanner, the updated software lets you quickly identify interferers that reduce MIMO performance in LTE networks. Read more:
http://www.tmworld.com/article/520644-R_S_drive_test_software_gains_MIMO_functions.php
 

GL's ATM emulator performs IMA simulations
Software from GL Communications simulates inverse multiplexing of ATM cell streams over multiple physical links, retrieving the original stream at the far-end from these physical links. The IMA (Inverse Multiplexing over ATM) emulator application performs IMA simulations on up to 16 T1/E1 ports and allows ATM links to be created on full or fractional timeslots. Read more:
http://www.tmworld.com/article/520646-GL_s_ATM_emulator_performs_IMA_simulations.php
 

AWR expands software offerings for Anritsu instruments
AWR now offers its VSS (Visual System Simulator) communications-design software for use with Anritsu's MS269xA/MS2830A signal analyzers and MS269xA-002/MS2830A-02x vector-signal-generator options (SA/VSG). VSS is available as part of the AWR Connected for Anritsu series, which initially teamed AWR's Microwave Office software with Anritsu's VectorStar vector network analyzers. Read more:
http://www.tmworld.com/article/520275-AWR_expands_software_offerings_for_Anritsu_instruments.php
 

SeeHawk drive-test suite supports TD-LTE, LTE-MIMO
SeeHawk 2.0 software from PCTEL enables both drive test and in-building RF data collection when used with the company's SeeGull RF scanning receivers. This latest version of the wireless drive-test suite supports PCTEL's Clarify interference-management system, as well as TD-LTE and LTE-MIMO implementations on the SeeGull EX, and all mapping and reporting capabilities across the entire SeeGull product family. Read more:
http://www.tmworld.com/article/520440-SeeHawk_drive_test_suite_supports_TD_LTE_LTE_MIMO.php


Agilent adds multimeasurement to 89600 VSA software
A multimeasurement capability is now a standard feature of Agilent's 89600 VSA (vector signal analysis) software, enabling simultaneous signal analysis of multiple carriers and signal formats for efficient wireless testing. The new capability offers the performance of multiple signal analyzers with the convenience of a single, optimized user interface. Read more:
http://www.tmworld.com/article/520033-Agilent_adds_wireless_multi_measurement_capability.php


Data Translation offers free LV-Link 3.0 library of VIs
LV-Link 3.0 is a library of VIs (virtual instruments) from Data Translation that enables LabView programmers to access the data-acquisition features of DT-Open Layers-compliant USB and PCI devices. Read more:
http://www.tmworld.com/article/520361-Data_Translation_offers_free_LV_Link_3_0_library_of_VIs.php
 

Agilent updates VEE measurement software
An enhanced version of VEE, Agilent's graphical programming application for test and measurement, provides faster data analysis, greater instrument compatibility, and support for Windows 7. VEE 9.3 includes new sample programs for such instruments as the Agilent 33500 Series of function/arbitrary waveform generators, the 34411A digital multimeter, and InfiniiVision 2000X/3000X/5000/ 6000/7000 oscilloscopes. Read more:
http://www.tmworld.com/article/520129-Agilent_updates_VEE_measurement_software.php


Corelis ScanExpress JET supports multiple microprocessors.
Corelis recently announced that its ScanExpress JET software enables JTAG embedded testing of processors from Texas Instruments, AMD, and Freescale. The JET (JTAG Embedded Test) method provides at-speed testing of embedded processor-based electronic PCBs and systems to detect, isolate, and diagnose structural and functional defects, while minimizing test development time and resource investment.

• Texas Instruments Sitara ARM Cortex-A8 and ARM9 microprocessors, specifically the AM37x, DM37x, and AM18x families:
  http://www.tmworld.com/article/520366-Corelis_adds_JET_support_for_TI_Sitara_processors.php
  
  
• AMD Turion II Neo, Athlon II Neo, Opteron 4100, and Opteron Quad-Core families of devices:
  http://www.tmworld.com/article/519808-Corelis_ScanExpress_JET_supports_AMD_processors.php

• Freescale's i.MX51 family of application processors:
  http://www.tmworld.com/article/520127-Corelis_ScanExpress_JET_supports_Freescale_processors.php

XJTAG updates software with auto-suggest library
Version 2.6 of XJTAG's boundary scan software development system now comes with a library that can auto-suggest the correct file based on the bill of materials and net list information, enabling even faster set-up times. Read more:
http://www.eetimes.com/electronics-products/test-measurement/4233197/XJTAG-updates-software-with-auto-suggest-library


NI updates sound and vibration measurement software

With its new vibration datalogging functionality and other enhancements, National Instruments’ Sound and Vibration Measurement Suite 2011 lets you more easily customize and automate test and monitoring applications. The software suite provides a broad collection of analysis and signal-processing tools for NVH (noise, vibration, harshness) testing; MCM (machine-conditioning monitoring), and audio testing. Read more:

http://www.tmworld.com/article/519745-NI_updates_sound_and_vibration_measurement_software.php

LDRA tools and LabView ease DO-178 certification
The LDRA suite of automated software verification, source-code analysis, and test tools now works with National Instruments' LabView VIs (virtual instruments) to perform hardware-in-the-loop simulation for developing and testing the complex real-world embedded systems commonly found in military and aerospace designs. Together, the LDRA-NI solution delivers the hardware-testing capabilities and software competencies necessary to achieve DO-178 certification, up to and including Level A. Read more:
http://www.tmworld.com/article/520506-LDRA_tools_and_LabView_ease_DO_178_certification.php


LMS updates Imagine.Lab system-simulation platform
LMS International has released Revision 11 of its mechatronic system-simulation software, Imagine.Lab AMESim. This latest release includes features that address requests from customers in the automotive, aerospace, and mechanical sectors. Read more:
http://www.tmworld.com/article/520404-LMS_updates_Imagine_Lab_system_simulation_platform.php


Mentor enables component-to-system thermal characterization
Mentor Graphics has combined its T3Ster thermal transient tester with its FloTherm thermal simulation and analysis software to provide a combined methodology for optimizing heat management in devices, subsystems, and full systems. The T3Ster thermal characterization tester fully implements the JEDEC JESD51-14 measurement standard for the junction-to-case thermal resistance of power semiconductor devices. Read more:
http://www.tmworld.com/article/520407-Mentor_enables_component_to_system_thermal_characterization.php

 
Opera multiphysics simulation tool speeds EM design
Version 15 of the Opera electromagnetic simulator, from the Vector Fields Software business unit of Cobham Technical Services, adds 3-D mechanical-stress analysis that solves for deformations within the elastic limit of materials. Read more:
http://www.tmworld.com/article/520362-Opera_multiphysics_simulation_tool_speeds_EM_design.php