Multitest teams MEMS modules with test handler

Systems can be configured for devices ranging from 3×3 mm to 70×70 mm.

-- Test & Measurement World, 2/2/2012 7:00:00 AM

Semiconductor test-equipment manufacturer Multitest announced that it has shipped the first MEMS equipment for the MT9510 pick-and-place test handler to an IDM (integrated device manufacturer) in the US. The installation is for MEMS gyroscope testing and brings the positioning accuracy and tri-temperature performance of the MT9510 to the MEMS test arena.

The company's MEMS test and calibration modules are available for various applications, including high-g accelerometer, low-g accelerometer, gyroscope with constant yaw rate, gyroscope with sinusoidal stimulus, pressure sensor, electromagnetic applications, and 3-D electromagnetic compass test. Thanks to the platform's modular design concept, you can use exchangeable stimulus boxes within the MEMS module or even a combination of different stimulus boxes within one MEMS module. This allows up to 9 degrees of freedom in one test setup.

Accommodating up to 16 contact sites, the MT9510 tri-temperature pick-and-place handlers cover a full ambient-hot-cold temperature range of −55°C to +175°C. These systems can be configured for large and small devices, including QFP, BGA, PGA and QFN, in sizes ranging from 3×3 mm to 70×70 mm.

Multitest, www.multitest.com