Best in Test Winners 2012:
ATE/Production Test, Bus Analyzers, Data Acquisition, Design for Test/Boundary Scan
T&MW's editors have announced the winners of the 2012 Best in Test awards. Check out these photos from the awards ceremony.
-- Test & Measurement World, 2/6/2012 4:48:50 PM
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ATE/PRODUCTION TEST RFEM, Aeroflex  Ron Williamson of Aeroflex accepted the Best in Test award for the RFEM. Aeroflex designed a new RF expansion module (RFEM) at All Nippon Airways (ANA) for the Cassidian ATEC Series 6 automated test system for RF avionics testing. The Aeroflex RFEM, which resulted from a joint engineering effort with Cassidian and Honeywell, enables airlines to perform return-to-service testing. Based on Aeroflex's PXI3000 instruments, the RFEM is packaged in a tower identical in design to the ATEC Series 6 platform. Operators can add RF test capability to an installation by rolling up the RFEM and connecting it via a single Ethernet data cable. |
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BUS AND LOGIC ANALYZERS Beagle USB 5000 SuperSpeed Protocol Analyzer, Total Phase  Kumaran Santhanam accepted the Best in Test award on behalf of Total Phase. Starting at under $4000, the Beagle USB 5000 analyzer interactively displays USB 3.0/2.0 data as soon as it is captured on the bus. Class-level USB data is automatically parsed in a hierarchical display to help engineers drill down quickly to the data of interest. Since the USB data is presented immediately, engineers can avoid bottlenecks caused by waiting for captured data to be downloaded and parsed. |
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DATA ACQUISITION USB-2408 Series, Measurement Computing  Peter Anderson of Measurement Computing accepted the award for his company. The USB-2408 multifunction data-acquisition devices can directly measure thermocouples or voltage up to ±10 V at samples rates up to 1 ksample/s. Each device includes 16 singled-ended/eight differential analog inputs that can be configured for voltage or thermocouple input on a per-channel basis. Users can make accurate, 24-bit temperature or voltage measurements for under $600. Eight software-selectable voltage input ranges are also provided on a per-channel basis from ±10 V to ±0.078 V. Each device includes eight digital I/O and two counter inputs. |
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DESIGN FOR TEST/BOUNDARY SCAN SFX-TAP16/G, Goepel Electronic  Part of the ScanFlex product family, the SFX/TAP16-G TAP transceiver provides a flexible front end with per-TAP (test access port) exchangeable TAP Slot Cards, as well as integrated analog/digital resources and power-slot cards for the UUT (unit under test) power supply. With the ability to perform standard boundary-scan connectivity tests, in-system programming, processor-controlled test, and tests using chip-embedded instrumentation on 16 UUTs in parallel, the SFX-TAP16-G offers a modular solution for configuring stand-alone benchtop gang-test and gang-programming systems. |
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