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  • Best in Test Winners 2012:
    Embedded System Test, Functional Test, LTE Test, Machine Vision/Inspection

    T&MW's editors have announced the winners of the 2012 Best in Test awards. Check out these photos from the awards ceremony.

    T&MW Staff -- Test & Measurement World, 2/7/2012 11:42:09 AM

    Description: Best in Test Logo

    During a ceremony on January 31, 2012, we announced the winners of the Best in Test awards in the following categories. Martin Rowe, senior technical editor at Test & Measurement World, presented a plaque to representatives of the winning companies. (To read about all of the finalists in these categories, go to our finalists page.)
     






    EMBEDDED SYSTEM TEST

    TR5001T Tiny ICT, Test Research


    T&MW 2012 Best in Test Awards: Embedded Test
    Steve Marks and Barbara Koczera accepted the Best in Test plaque for the TR5001T Tiny ICT.

    The TR5001T Tiny ICT is a feature-rich board tester with a laptop-sized footprint that provides a cost-efficient alternative to large in-circuit testers. With a USB interface for connection to a PC or notebook, the TR5001T can use up to 640 analog test points, and it provides two fixed and four programmable device-under-test power supplies. The TR5001T software provides a full suite of tools, including auto debug of all passive tests, production displays, test coverage report, shop-floor control, custom datalogging, and revision control of both board and program.


    FUNCTIONAL TEST

    TOSCA Testsuite, TRICENTIS Technology & Consulting


    T&MW 2012 Best in Test Awards: Functional Test
    Jeff MacDonald of Tricentis USA accepted the Best in Test plaque for his company.

    TOSCA is a test-management, design, and execution toolset for functional and regression tests. In addition to its test-automation functions, TOSCA includes integrated test management and an application-programming interface. TOSCA Commander, the test suite’s execution tool, helps users create and analyze test cases. TOSCA Executor executes the test cases and displays the results. TOSCA Exchange Portal allows users to exchange special modules, extensions, and prebuilt TOSCA Commander components. Finally, Test Repository stores all test assets and can be accessed by multiple users.


    LTE TEST

    VR5 HD Spatial Channel Emulator, Spirent Communications


    T&MW 2012 Best in Test Awards: LTE Test
    Accepting the Best in Test award for the VR5 was Steve Heinen of Spirent Communications.

    Spirent’s VR5 HD Spatial Channel Emulator brings ease of use to testing MIMO/beamforming devices and base stations. The benchtop fader can handle 8x4 MIMO, TD-LTE, LTE-Advanced, and bidirectional/handover testing scenarios. The system packs dozens of emulated radio links into a single 6U unit, without requiring racks of external RF equipment. The touch-screen interface simplifies the management of complex MIMO scenarios, and the setup GUI offers graphical feedback so intricate test cases can be run quickly.


    MACHINE VISION/INSPECTION

    TR7600 SII Automated X-Ray Inspection System, Test Research


    T&MW 2012 Best in Test Awards: Machine Vision/Inspection
    For the second time during the ceremony, Steve Marks and Barbara Koczera accepted a Best in Test plaque for Test Research.

    The TR7600 SII answers the increasing demand for 3-D x-ray inspection of PCB assemblies. It combines the digital tomosynthesis technology and TR7600 SII software to allow measurements to be taken at various slice heights during a single inspection cycle. Users can optimize settings with selectable resolutions (20 µm, 15 µm, 10 µm, and 5 µm) to inspect 0210 and 01005 passive devices and microBGAs. Use of multiple resolutions in a single test minimizes cycle time while improving test effectiveness on fine-pitch parts.


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