Best in Test Winners 2012:
RF/Microwave Test, Semiconductor Test, Signal Analyzers, Signal Sources, Source-Measure Instruments
T&MW's editors have announced the winners of the 2012 Best in Test awards. Check out these photos from the awards ceremony.
T&MW Staff -- Test & Measurement World, 2/7/2012 1:29:15 PM
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RF/MICROWAVE TEST URT-5000 Software Defined RF Player and Signal Generator, Averna  The Averna URT-5000 RF signal source uses Averna’s protocol-specific signal-generation toolkits and signal libraries to generate and impair common navigation and broadcast radio signals for receiver design validation, testing, production, and support. The Averna URT-5000 supports RF playback of real-life signals that are often too complex to generate. Numerous units can be synchronized to support more than one channel. Going beyond simple commercial broadcast transmitters, the Averna URT-5000 signal generator and toolkits enable the addition and fine adjustment of common impairments to the signal. |
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SEMICONDUCTOR TEST T5773 NAND Flash Package Tester, Advantest  NAND manufacturers require a test system that lowers test costs while offering an operating frequency range that can support ONFI3 interfaces. Advantest’s NAND flash-memory test systems meet this need. The company's T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets, and other applications, and it can handle new device types that demand upwards of 4X the test speeds previously required. The T5773, which has an operating frequency range of 200 MHz/400 Mbps, can test more than 768 devices in parallel. |
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SIGNAL ANALYZERS PXIe-5665 VSA, National Instruments  The NI PXIe-5665 is a modular, three-stage superheterodyne analyzer that can be used as both a spectrum analyzer and a vector signal analyzer to perform signal measurements over a frequency range from 20 Hz to 3.6 GHz/14 GHz. This modular instrument also takes advantage of multicore computing architectures and parallel programming capabilities through NI LabView system-design software. The PXIe-5665 also offers peer-to-peer data streaming for signal processing and a flexible MIMO architecture for phase-coherent measurements. |
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SIGNAL SOURCES M8190A Arbitrary Waveform Generator, Agilent Technologies  Ken Poulton of the Agilent Technologies Measurement Research Laboratory accepted the award for the M8190A. The Agilent M8190A Arbitrary Waveform Generator simultaneously delivers high resolution and wide bandwidth, letting you create signal scenarios that push a design to the limit and bring new insights to your analysis. The Agilent M8190A ensures accuracy and repeatability with 14-bit resolution, an 8-Gsamples/s sampling rate, and up to 80-dBc SFDR. Agilent says the high dynamic range and excellent vertical resolution give you confidence that you are testing your device, not the signal source. |
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SOURCE-MEASURE INSTRUMENTS B2900A Series Precision Source/Measure Unit, Agilent Technologies  Agilent’s B2900A Series precision source-measure units are cost-effective source-measurement solutions for production-test applications. The units have broad voltage-sourcing (210 V) and current-sourcing (3 A DC and 10.5 A pulsed) capability with a minimum 10-fA/100-nV sourcing-and-measuring resolution. In addition, Agilent says several task-based viewing modes improve productivity for test, debug, and characterization. The high-throughput instruments support the conventional SMU SCPI command set for easy test code migration. |
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