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How software enhances boundary scan

Development, run-time, and reconfiguration environments are keys to establishing your test methodology.

Rick Nelson, Executive Editor -- Test & Measurement World, 3/1/2003

Glossary

Boundary scan is becoming indispensable to the cost-effective production of dense PCBs. Boundary-scan implementation begins with the software that helps you design boundary-scan-compatible PCBs and develop the test vectors that your lab and production equipment will use to exercise them.

Figure 1  ScanPlus Viewer software combines photographic images and detailed layout descriptions to help design and test engineers isolate faults. Courtesy of Corelis.


Boundary-scan software plays a role in the development environment, in run-time production test, and in field service. Complementing the basic boundary-scan software are tools that provide such capabilities as schematic viewing or test-coverage analysis.

Boundary scan's goal is to provide input vectors to a product under test via a minimum number of test I/O lines—ideally the four lines (clock, data in, data out, and test mode select) defined in the IEEE 1149.1 standard (Ref. 1). The technology also evaluates the corresponding output vectors. A variety of hardware options—from stand-alone boundary-scan controllers to production-floor in-circuit testers (Ref. 2)—can generate and acquire those signals, but software determines what values those signals should take.

Boundary-scan design flow

A typical boundary-scan design begins with a parts list containing boundary-scan-compliant as well as non-compliant devices. The compliant devices come with boundary-scan description language (BSDL) files that describe their behavior with respect to boundary-scan Test Access Port (TAP) inputs and outputs. These files, along with board schematic information from PCB electronic-design-automation (EDA) tools, serve as the input to boundary-scan development software tools, such as Acculogic's ScanManager, Asset InterTech's ScanWorks, Corelis's ScanPlusTPG, Goepel Electronic's System Cascon, Intellitech's Eclipse Test Development Environment, and Teradyne's Victory.

Those tools develop the patterns necessary to test boundary-scan devices and configure in-system-programmable devices. In addition, they can suggest test strategies for clusters of non-boundary-scan-compliant devices, determine fault coverage, and suggest possible test-point additions that extend fault coverage at minimal cost.

Thomas Wenzel, vice president at Goepel Electronic (Jena, Germany), says that when choosing boundary-scan tools, customers typically evaluate software first. Only in applications requiring high-speed flash programming (Ref. 3) do they think of hardware first. He recommends a fully integrated boundary-scan development environment (incorporating a frame structure with plug-ins), such as his firm's System Cascon, in place of a combination of stand-alone tools.

Dave Bonnett, technical marketing manager at Asset InterTech, emphasizes that it's important for prospective customers to look beyond their immediate needs: "First time or inexperienced users usually have a very focused view of a boundary-scan system. They are cost-sensitive, and they want to know if the system will solve a particular problem that they are currently facing."

In contrast, Bonnett adds, experienced users are more concerned about the broad capabilities of the boundary-scan system under consideration and whether it can effectively integrate with other processes and procedures. The more mature user usually wants to know how tests and programming operations generated by a boundary-scan system will support prototype debug, as well as how they will work with in-circuit test, functional test, BIST (built-in self-test), and other types of test. Says Bonnett: "One of [Asset InterTech's] ScanWorks' strengths is its ability to enable test re-use." This extends from design and development into manufacturing as well as environmental-chamber and other types of testing.

Menachem Blasberg, president of Corelis, agrees that an effective boundary-scan system should work well with other test and development tools you have in place. What's nice about Corelis software, as well as its competitors' software, he contends, is that you can call and execute boundary-scan tests from other programs such as LabView, Agilent Vee, and custom test executives. That can facilitate testing for customers who decide to forgo in-circuit test in favor of coupling functional tests developed within LabView, for example, with boundary-scan tests.

From DC test to ISP

Originally conceived as a low-speed or DC interconnect test standard, IEEE 1149.1 has yielded new standards (Refs. 4, 5, and 6). Those new standards define the programming of onboard flash memory. In addition, one of those standards—IEEE 1582——defines the configuration (or field reconfiguration) of in-system-programmable (ISP) field-programmable gate arrays (FPGAs) and programmable logic devices (PLDs).

From product development to field service, boundary-scan software offerings cover a wide price-and-performance spectrum. Products range from less-than-$1000 versions offering only low-speed IEEE 1149.1 test to $50,000 systems that offer DC test and AC test as well as flash programming and programmable-device configuration in accordance with IEEE 1582 and other emerging specs, plus such bells and whistles as schematic viewers (Figure 1) and test-coverage analyzers.

A typical high-end software package is Corelis's ScanPlusDFT, which, according to Blasberg, can evaluate boards and systems that include a mix of boundary-scan and non-boundary-scan devices. ScanPlusDFT reports test coverage of every net and pin on the board and indicates whether a net or pin is fully testable, partially testable, or nontestable. It suggests where test points can be added to enhance testability while reducing the need for nails in in-circuit-test fixtures. Another feature—Corelis's support for testing embedded cores in semiconductor devices—has earned Corelis "LogicVision Ready" status. This means Corelis has demonstrated that its tools support tests of ICs containing LogicVision embedded-test intellectual property (IP).

Test effectiveness

Ray Dellecker, US marketing manager at JTAG Technologies, notes that if he had to select one issue that has a major impact on the overall effectiveness of boundary scan, it would be the quality and capabilities of the test-development software. He adds that software can provide high levels of automation, but the software's test generator must do a thorough and reliable job, evaluating all possible nets and conditions. "Our software tools achieve a balance between pushbutton operation and verification of the designer's intent," says Dellecker. "Other factors, such as board design, BSDL quality, and links to the EDA system, are becoming much more manageable these days as the industry has matured."

Corelis's Blasberg notes that poor-quality BSDL files have been a main restraint on boundary-scan's effectiveness, but he agrees that BSDL problems have been drastically reduced in the past couple of years. Matt Van Wagner, director of sales and marketing at Flynn Systems, attributes BSDL improvements in part to the efforts of Agilent Technologies' Kenneth Parker, who helped establish a free Web-based automated BSDL syntax checker (www.ate.agilent.com/emt/library/smart_tools/verification).

Improvements in BSDL files leave other factors to determine overall effectiveness of boundary-scan implementations. Wenzel at Goepel Electronic cites such factors as the performance of a chosen boundary-scan system and the skill of the design and test engineers who develop boundary-scan-enabled PCBs and their test procedures. Bonnett at Asset InterTech agrees: "The main determinant in the effectiveness of boundary-scan test is the quality of the design-for-test (DFT) practices followed by the development group. Unfortunately, no boundary-scan software system can overcome DFT deficiencies."

Tom Jackson, director of marketing and sales at Intellitech, elaborates: "There is a misconception in the market, caused by some of the vendors themselves, that IEEE 1149.1 tools are not sophisticated and do not require technical expertise to evaluate. This is not the truth. DFT . . . is a global design issue and must be treated as such. Today, DFT means much more than daisy-chaining ICs in the 1149.1 chain."

To that end, says Jackson, Intellitech provides infrastructure IP to system designers to help them implement effective strategies for embedded configuration and test. The company's patent-pending IP "provides a scalable configuration, debug, and test infrastructure that enables customers to build self-testable and in-the-field reconfigurable products." The company's products include SystemBIST IP, a plug-and-play IP module that enables IEEE 1532-compliant in-system configuration and IEEE 1149.1 test; FAC IP, an IP module that programs flash memory in-system at maximum speed; and Scan Ring Linker IP, which links multiple scan rings (secondary scan paths) into a single high-speed test bus, permitting devices on secondary scan chains to be independently tested and configured through a single IEEE 1149.1 external interface.

Says Bonnett at Asset InterTech, "Each boundary-scan tool vendor has unique test-generation tools with vendor-specific methods of applying the tests and diagnosing the results." Vectors developed on one vendor's platform, he said, can be transported to another vendor's platform by using industry-standard Serial Vector Format (SVF) files, but diagnostics on alternative platforms is generally limited to pass/fail. Apart from the SVF standard, Asset for its part has pursued seamless integration with Agilent Technologies' 3070 in-circuit test systems and with Teradyne's Victory boundary-scan software. Wenzel at Goepel noted that PLD formats such as Jam STAPL (see "Glossary," p. 28) can complement SVF for effective transfer of boundary-scan data among diverse platforms.

The price is right

Dellecker at JTAG Technologies puts the typical capital investment for boundary-scan testing at 10% to 20% of the investment required for traditional testing. Nevertheless, some see the cost of boundary-scan test as still too high. In an alliance formed to make JTAG testing more affordable to mainstream test and design engineers, Ricreations and Flynn Systems announced last November that they will jointly market their sub-$1000 Universal Scan and onTAP boundary-scan-test software packages. Ricreation's Universal Scan focuses on manual debugging of JTAG scan chains and circuits; Flynn Systems' onTAP provides ATPG for full automated board test.

Says Flynn's Van Wagner, "Hardware designers are vitally important to the implementation of boundary-scan DFT. The more affordable boundary-scan tools are, the more likely hardware designers are to use them. These designers are much more likely to consider tools that are under $1000 than tools that cost $10,000 to $50,000."

For more information

Bonnett, David,"IEEE 1149.1 yields new standards," Test & Measurement World, April 2002. www.tmworld.com/archives

Stanbridge, James, "Bridges enhance system boundary scan," Test & Measurement Europe, February-March 2002. www.tmworld.com/archives


Manufacturers of boundary-scan software
Acculogic
Markham, ON, Canada
909-475-5907
www.acculogic.com
Agilent Technologies
Santa Clara, CA
800-452-4844
www.agilent.com
Asset InterTech
Richardson, TX
888-694-6250
www.asset-intertech.com
Corelis
Cerritos, CA
562-926-6727
www.corelis.com
Flynn Systems
Nashua, NH
603-598-4444
www.flynn.com
Goepel Electronics, USA
Austin, TX
512-502-3010
www.goepel.com
Intellitech
Durham, NH
603-868-7116
www.intellitech.com
JTAG Technologies
Stevensville, MD
877-367-5824
www.jtag.com
Ricreations
Suwanee, GA
678-455-7255
www.universalscan.com
Teradyne, Assembly Test Division
Walnut Creek, CA
925-932-6900
www.teradyne.com
   


Author Information
Rick Nelson received a BSEE degree from Penn State University. He has six years experience designing electronic industrial-control systems. A member of the IEEE, he has served as the managing editor of EDN, and he joined T&MW in 1998. E-mail: rnelson@tmworld.com.


References
  1. IEEE 1149.1-2001, "Test Access Port and Boundary-Scan Architecture," IEEE. Piscataway, NJ. www.ieee.org.
  2. Nelson, Rick, "PCB test: nails or TAP?" September 2002. www.tmworld.com/archives.
  3. Kerridge, Brian, "Flash stretches boundary-scan limits," Test & Measurement Europe, June-July 2002. www.tmworld.com/archives.
  4. IEEE 1532, "Standard for In-System Configuration of Programmable Devices," IEEE, Piscataway, NJ. www.ieee.org.
  5. IEEE P1500, "Standard for Embedded Core Test (SECT)," IEEE, Piscataway, NJ. www.ieee.org.
  6. IEEE P1581, "Standard for Static Component Interconnection Test Protocol and Architecture," IEEE, Piscataway, NJ. www.ieee.org.
  •  

    Glossary

    BSDLBoundary-scan description language, which semiconductor vendors use to describe the boundary-scan behavior of their IEEE 1149.1-compliant devices.

    JamAn open-standard interpreted language for the programming of in-system-programmable devices via an IEEE 1149.1 interface (www.jamisp.org).

    STAPLStandard test and programming language, pioneered by Xilinx (www.stapl.org) and adapted by other device vendors.

    SVFSerial vector format, a de facto standard for boundary-scan device definitions.

    TAPTest Access Port, the boundary-scan interface defined in the IEEE 1149.1 standard.

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