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APEX 2003; Optical Fiber Communications Conference 2003

Staff -- Test & Measurement World, 5/1/2003

Optical Fiber Conference:
OFC addresses network test

Inspection and electrical test emerge at Apex

IPC Apex 2003, March 31–April 2, 2003, Anaheim, CA, www.goapex.org.

X-RAY INSPECTION

The FeinFocus (www.feinfocus.com) µCT FOX combines 2-D technology with 3-D computed tomography (CT) to provide 3-D position information while maintaining a constant x-ray-intensity. . . .The 5DX Series 5000XL from Agilent Technologies (www.agilent.com) provides 90% fault coverage for 24x40-in. complex PCBs. . . .A three-axis manipulator enables the Viscom (www.viscomusa.com) X8011 system to examine BGAs or 10-kg assemblies in 3-D within its 360x410-mm inspection area. . . .Dage Precision Industries' (www.dageinc.com) XT6600 submicron-resolution machine offers magnification to 5800X over its 16x18-in. inspection area. . . .X-Tek (www.xtekxray.com) introduced drill-offset-measurement and Excel-compatible software for its real-time x-ray inspection systems. . . .Computed tomography enables the v|tome|x from Phoenix X-ray (www.phoenix-xray.com) to develop 3-D radiographic representations of an IC package's lead frame and bond wires.

OPTICAL INSPECTION

Teradyne's Optima 7210 builds process knowledge and variation awareness into image analysis, automatically compensating for normal and acceptable variations in the PCB manufacturing environment.

Metcal's VPI-1000 benchtop optical inspection system minimizes lens-reconfiguration requirements during surface-mount-device inspection; it includes 3-D analysis software. . . .Omron's (www.omron.com) Orion PCB inspection software combines data monitoring and analysis capabilities and works with all of the company's VT-WIN II automated optical inspection systems. . . .The SJ50 Series II AOI system from Agilent examines components and solder joints using 3-D shape analysis. . . .Teradyne's (www.teradyne.com) Optima 7210 automated optical inspection system serves in post-placement, inline defect detection. The system employs object-recognition and image-analysis capabilities to replace user judgment.

IN-CIRCUIT TEST

An upgrade to TestJet capacitive probing for the Agilent 3070 in-circuit test (ICT) system, Agilent's Test EP offers 50% better pin coverage. . . .JTAG Technologies' (www.jtag.com) Symphony 3070 hardware and software boundary-scan upgrade package for the Agilent 3070 enables users of Unix- or PC-based 3070 systems to run ICT programs in conjunction with boundary-scan programs. . . .Teradyne's TestStation LH in-circuit tester is a half-footprint, scalable version of the company's TestStation 12X product family.

SOFTWARE

Agilent's Quality Tool software addition to its Intelligent Test framework provides feedback to line engineers who monitor and troubleshoot PCB assembly, test, inspection, and repair processes. . . . Tecnomatix Technologies (www.tecnomatix.com) introduced its eM-Assembly Expert 2.0, which automates assembly, test programming, documentation, and parametric optimization. . . .National Instruments (www.ni.com) introduced DMM software that delivers 1.8 Msamples/s of isolated digitizer data from the company's 6.5-digit FlexDMM.

EQUIPMENT LIFE-CYCLE MANAGEMENT

GE Global Electronics Solutions (www.geelectronicsweb.com) featured its equipment acquisition, optimization, and disposition services for companies that manufacture and test printed-circuit assemblies or semiconductors. GE provides customers with leasing, purchasing, and equipment-evaluation and location services.


OFC addresses network test

Optical Fiber Communications Conference, March 23–27, 2003, Atlanta, www.ofcconference.org .

Apcon (www.apcon.com) added a SONET/SDH blade to its line of optical switches; the blade provides optical interfaces for OC-3 (155 Mbits/s), OC-12 (622 Mbits/s) and OC-48 (2.488 Mbits/s) connections. . . .Ixia (www.ixiacom.com) enhanced its 40-Gbits/s bit-error-rate tester with four new I/O modules. . . .Anritsu (www.us.anritsu.com) combined an RF vector-network analyzer and a NIST-characterized photodiode to characterize optical components to 65 GHz, and it introduced a optical sampling oscilloscope that captures digital data streams at a 500-GHz effective sampling rate. . . .Tektronix (www.tektronix.com/optical) added three modules—to 30-GHz bandwidths—to its CSA8000 series of optical sampling oscilloscopes. . . .Inphi (www-inphi-corp.com) displayed modulator drivers for 10 Gigabit Ethernet systems. . . .Agilent Technologies (www.tm.agilent.com) expanded the 81250 ParBERT's bandwidth to cover the range of 500 Mbits/s to 13.5 Gbits/s, and it introduced the Model E2158A optical amplifier test system and JS-1000 SONET jitter-measurement system. . . .LeCroy (www.lecroy.com) showed engineers a 6-GHz optical-to-electrical converter for the company's line of DSOs and signal analyzers.

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