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Isolate DC voltage spikes

Martin Rowe, Senior Technical Editor -- Test & Measurement World, 6/1/2003

When testing semiconductor devices, you often need to measure drain current or leakage current as a function of voltage. A DC voltage source and a DMM can easily make these measurements under computer control. But many voltage sources will produce spikes when you switch their output values. Fortunately, you can run a simple test to determine the accuracy of your voltage source as it changes values during a voltage sweep.

Transconductance measurements can reveal spikes in drain current lnked to spikes in source voltage.

Measuring transconductance on a MOSFET device can reveal errors in a voltage source. To make this measurement, you sweep a voltage source across the gate (VG) over the device's input range and measure the drain current (ID). The figure shows a waveform of conductance and drain current verses gate voltage and reveals spikes in conductance (red trace) even though ID (blue trace) appears smooth. The spikes in transconductance appear because of voltage spikes produced when the VG voltage sources changes output values. Therefore, if you see unexpected disturbances in measured values, don't assume the problem is in the DUT. Check the signal source to make sure you're not introducing unwanted signals. A low-pass filter should minimize the voltage spikes.

To learn more tips and tricks for DC measurements, download a paper by Lee Stauffer of Keithley instruments at www.tmworld.com/voltage.

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