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The hardware gets softer

Steve Scheiber, Contributing Technical Editor -- Test & Measurement World, 7/1/2003

Once upon a time, manufacturing test consisted of collections of rack-and-stack instruments. Engineers attached connectors and twiddled dials to get desired information. The instruments have become more sophisticated, but their basic principles remain. Analog oscilloscopes yielded to DSOs, for example, but a transplanted engineer from that earlier time would still recognize a scope (always remembering the precept offered by science fiction author Ray Bradbury many years ago—"A sufficiently advanced technology is indistinguishable from magic"). Over the last few years, the boxes themselves have begun to fade away. Sometimes the box exists, but at the other end of a phone line from the engineer, who controls it by direct connection or through the World Wide Web. This approach works particularly well for contract manufacturers (CMs). OEM designers can examine manufacturing and test parameters at CM facilities in real time, a huge savings in time and money.

"Virtual" instruments possess no boxes of their own at all. The function resides on a printed circuit board plugged into a conventional personal computer, interacting with the unit under test through the board's I/O.

The instrument's operation is emulated in software—including the traditional front panel. Packages such as National Instruments' LabView, Agilent's Vee, and Geotest's ATEasy serve this category. Sometimes the "instrument" interacts only with another collection of ones and zeros—a product and production line simulation.

With the latest innovation, so-called "synthetic instruments," a generic piece of measurement hardware with a high-speed ADC and DAC at its core is entirely controlled by function-specific software. A piece of hardware might act like a voltmeter one instant, a spectrum analyzer a moment later, and a power meter after that, mimicking an entire rack of expensive stand-alone instruments. The economics of such a solution prove very attractive to prototyping, pre-production, and low-volume/high-mix operations.

Instrument boxes are fading away, with software emulations replacing front panels. Courtesy of National Instruments.

Chris Nadovich of Julia Thomas Associates (www.jtan.com), one of the chief proponents of this approach, called the innovation "the most significant advance in electronic test and measurement since the introduction of ATE." He contends that the introduction of synthetic instruments will profoundly affect all new test-and-measurement equipment development.

People often contend that "there is nothing new under the sun." Perhaps not, but if you "look under the hood" of these latest instrument architectures, you'll find the hamster running on the wheel is only a hologram.

Steve Scheiber, Contributing Technical Editor sscheiber@aol.com

 

Battery and charger simulator

Keithley Instruments' Model 2306-VS dual-channel fast transient power supply targets handset and cellular-component manufacturers. To speed production-test throughput, the $3495 instrument features external triggering, which allows for synchronized/deterministic control of output voltages and measurements, and automated voltage stepping, which lets users load programs that can run without delays due to communications overhead. www.keithley.com.

Connecting board-test fixtures

Prefix has introduced a method for controlling the insertion and extraction of test probes and connectors in functional and in-circuit test fixtures. Under tester control, the small, lightweight Modular Integrated Pneumatic Connector Device (MIPCD) pneumatically inserts one or more cards or any number of edge connectors or spring-loaded test probes into a board under test. After testing, the software releases the PCDs, allowing the operator to insert the next board. www.prefixinc.com.

Application note addresses communications test

An application note from Agilent Technologies examines communications testing and offers specific hints for the manufacturing test stage. "Designing and Testing 3GPP W-CDMA User Equipment" (#1356) provides an overview of CDMA technology, noting that average RF power will remain a common measurement for manufacturing test, even for complex modulation schemes such as CDMA. It further notes that error vector magnitude will remain a key measurement in manufacturing while block-error-rate tests won't be practical in the production stage. www.agilent.com.

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