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Near-field probes sniff circuits

Simple probes help you track down offending emissions.

Martin Rowe, Senior Technical Editor -- Test & Measurement World, 8/1/2003

Bend your own probe
Representative manufacturers of near-field probes

Before sending an electronic product to a lab for compliance testing for EMI emissions, you can perform a precompliance (far-field) EMI scan on the product with a spectrum analyzer and an antenna. If the product's emissions occur at amplitude levels that exceed limits set by national and international standards, you'll need to hunt down emissions sources and mitigate the problem.

You can often uncover the source of EMI emissions with near-field probes. Near-field magnetic (H-field) and electric (E-field) probes let you "sniff" where EMI lurks—around circuits, cables, and enclosures. H-field probes use a conductive loop to detect magnetic fields produced by clock signals, serial data streams, control signals, and switching power supplies. The probes produce a voltage proportional to the magnetic field that's perpendicular to the loop. The larger the loop, the more energy it will capture and the higher the voltage output. To find emissions on individual pins or PCB traces, use E-field probes that make direct contact with your circuit.

Figure 1. Near-field probe sets may include three sizes of H-field loop probes and one E-field contact probe. Courtesy of EMC Test Systems.

You'll often need more than one size of H-field probe to help you zero in on an emission. Commercial probe kits provide up to three H-field probes with different loop diameters (6 cm, 3 cm, and 1 cm) and either one or two E-field probes (Figure 1). Many EMC engineers build their own near-field probes because they're easy to make. "Bend your own probe," p. 34, shows how to construct both H-field and E-field probes.

Before you reach for near-field probes to track down emissions, though, you should learn as much as possible about the offending signals. Reduce the spectrum analyzer's resolution bandwidth from the typical 120 kHz required by standards. As you reduce the bandwidth, you may find modulation around a peak. Modulation will tell you if more than one emission contributes to the excessive level.

Mike Murphy, EMC engineer at ETL Semko (Boxborough, MA; www.etlsemko.com) suggests that you also use a spectrum analyzer's demodulation feature, which lets you listen to the modulation's sound. You can then listen for the offending emissions as you "sniff" around your product.

After you identify and understand the nature of the offending signals, you can take your EUT back to your engineering bench to tweak your product. But be sure to make some far-field baseline measurements first. By making these measurements, you'll be able to determine whether the emissions drop sufficiently after you make design changes.

Not quite Sherlock Holmes

Once you've made your baseline measurements, you can use H-field and E-field probes to try to find the source of the emissions. You may need to experiment with design modifications and repeated near-field measurements to get to the heart of the problem. Tim Dwyer, EMC program manager at TUV Rheinland (Newtown, CT; www.us.tuv.com), points out that RF emissions from a PCB can couple into cables or metal enclosures, which then radiate the emissions. "With near-field probes," says Dwyer, "you have about a fifty-fifty chance of finding the source of the offending emissions."

Figure 2. EMI will find the best radiator in the system, even an opening on the other side of the enclosure.

Openings in enclosures let emissions escape, but they can also cause current to flow in the metal enclosures. Figure 2 shows how an emission that originates on a PCB can cause current to flow in an enclosure. Coupling, caused by an opening in the enclosure's rear, produces the current. Another opening, perhaps on the opposite side of the enclosure, may turn the current back into a magnetic field that radiates outward. Your H-field probe may find the offending emission there. You then must either try to close the gap with EMI gaskets or go inside the enclosure to find the emission's source.

You can also use an H-field probe to measure the relative current in an enclosure. Place your loop parallel to and as close to the enclosure as possible. Using an oscilloscope, measure the peak voltage output of a magnetic field probe before and after you make design changes to a circuit. You can also estimate the current in the enclosure. The transfer impedance of a 2.5-cm square loop is about 6 Ω from 100 MHz to 1 GHz (Ref. 1). Knowing that impedance, you can calculate current from a voltage measurement.

H-field probes can lead you to a cable that's emitting RF energy, which often couples from the signal's source because of a poor or incomplete shield surrounding the cable's connector. A near-field probe will help you identify a cable that's acting as a radiating antenna. Once you find that cable, you should use current probes around the cable to measure common-mode current that causes emissions.

EMC Engineer Mike Murphy uses an H-field probe to find EMI emissions. Courtesy of ETL Semko.

If you can isolate the source of the excessive emissions with an H-field probe, you should measure the distance and note the location of the probe relative to the source, recommends Mark Briggs, director of engineering at Elliott Labs (Sunnyvale, CA; www.elliottlabs.com). Measure the amplitude of the offending frequency at that distance. After you make design changes, measure the emission at the same distance. Then, try using your dipole antenna to see if you get a drop in far-field emissions. If you see an acceptable drop in emissions, you're ready to perform another round of precompliance tests.

While using near-field probes, keep a circuit schematic and board layout nearby to help you navigate the EUT. You may find, for example, a bypass capacitor that's too far away from an IC to adequately suppress emissions, says ETL Semko's Murphy. Look at the power and ground pins on the IC in question. If either or both show ringing, then the bypass capacitor is either too small or too far away from its IC. The result: excessive emissions. You've correctly located your EMI problem.


Author Information
Martin Rowe has a BSEE from Worcester Polytechnic Institute and an MBA from Bentley College. Before joining T&MW in 1992, he worked for 12 years as a design engineer for manufacturers of semiconductor process equipment and as an applications engineer for manufacturers of measurement and control equipment. m.rowe@tmworld.com.


Reference
  1. Smith, Douglas C., "Signal and Noise Measurement Techniques Using Magnetic Field Probes," 1999 IEEE International EMC Symposium Proceedings, IEEE, Piscataway, NJ. emcesd.com/pdf/emc99-w.pdf.
 

Bend your own probe

You can make your own near-field probes from cables, paper clips, and capacitors.

You can easily build a near-field probe using materials in your engineering lab. For the simplest H-field loop probe, you need a piece of 50-Ω coax cable (Figure A). Remove the outer insulation and expose the shield around the center conductor. Then, loop the exposed center conductor to the shield and solder them together.

You can also make a loop from a paper clip (Figure B). Solder one end of the clip to a female BNC connector's center pin and solder the other end of the clip to the connector's shell. Use a BNC cable to connect the probe to your equipment. To prevent shorts as you use the probe, insulate the loop with heat-shrink tubing. The paper clip is more rigid than the coax cable's conductor, but it's also harder to shape.

Both of the above probes lack a shield around their loops. Without a shield, a probe will pick up energy from electric fields as well as magnetic fields. To eliminate the effects of electric fields, use a piece of shielded coax cable (Figure C). Connect the shield and one end of the cable's inner conductor to the BNC connector's shield. Make a small gap in the shield at the halfway point around the loop.

When you need to measure emissions down to the pin or trace level, you can use an E-field probe. Near-field probe kits come with E-field probes, but you can easily make one. In its simplest form, an E-field probe consists of a piece of 50-Ω coax cable with about ¼-in. of the center conductor exposed. You simply touch the conductor to the pin or trace that you want to measure.

This simple probe works well if the pin you want to measure has no DC component. But this probe won't work on PCB traces and pins that carry power to devices. To eliminate the DC component from your measurement, solder a small capacitor, such as a 39-pF capacitor, to the end of the conductor (Figure D). Then, use the capacitor's other lead as your probe.

Representative manufacturers of near-field probes

ARA Technologies, Deer Park, NY, www.aratech-inc.com

B&K Precision, Yorba Linda, CA, www.bkprecision.com

Com-Power, Lake Forest, CA, www.com-power.com

Credence Technologies, Soquel, CA, www.credencetech.com

Electro-Metrics, Johnstown, NY, www.electro-metrics.com

EMC Test Systems, Cedar Park, TX, www.emctest.com

Fischer Customer Communications, Torrance, CA, www.fischercc.com

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