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Data, data everywhere

Steve Scheiber, Contributing Technical Editor -- Test & Measurement World, 9/1/2003

Today's powerful computer tools give us free access to enormous volumes of data. In many situations, though, we suffer from the "forest and trees" problem—lots of details obscuring our view of the bigger picture.

Nowhere is this dilemma more acute than in the sometimes rocky relationship between contract manufacturers and their OEM customers.

SigmaQuest SigmaSure analysis software works wiht National Instruments' LabView to provide access to test and process data. Courtesy of SigmaQuest.

Wherever a design originates, chances are that production occurs at one or more locations far removed from design decisions. OEMs struggle mightily to take advantage of market windows that constantly threaten to close before products are out the door. At the same time, contract manufacturers have to maintain a level of product consistency among factories flung across thousands of miles while operating on slim profit margins. To forge a successful partnership, OEMs must understand the manufacturing process and CMs must appreciate every product's unpredictable life of throughput variations, bug fixes, updates, and enhancements.

How can OEMs and CMs exploit the available data to figure out what is really going on? Both parties must monitor all stages of the production process taking place anywhere in the world in real time, even troubleshooting remotely when necessary. This approach shortens lag time before addressing difficult problems and reduces the need for travel to the manufacturing site—a considerable cost savings. It also permits consolidating all data from all manufacturing facilities, no matter where they are, so that even rarely occurring failures will yield to analysis. Although the need to identify and prevent rare failures is obvious in avionics, medical electronics, and other "mission-critical" applications, even a defect that is not life-threatening can indicate necessary product or process changes that improve product quality and lower costs.

When consolidating data collection from far-flung data tools, OEMs and CMs must also maintain accurate version control. Version mismatches between process documentation, test programs, and analysis tools from station to station and factory to factory can spell disaster for even the most diligent manufacturer.

Many CMs have created their own proprietary solutions to track their processes and analyze the resulting data, with mixed success. Fortunately, off-the-shelf solutions are emerging as well. SigmaQuest (www.sigmaquest.net), for example, has integrated its SigmaSure analysis software with National Instruments' (www.ni.com) LabView 7 and LabWindows platforms to provide comprehensive access to test and process data and analysis. This combination allows manufacturers to detect failure patterns earlier in the process, hopefully before too many higher-cost or inferior products ship to customers. Considering how quickly products and processes change these days, the only path to success is to remain flexible enough to dance the right steps to whatever tune the piper plays.

Steve Scheiber, Contributing Technical Editor, sscheiber@aol.com

 

Equipment Reliability Institutes offers ESS courses

The Equipment Reliability Institute has scheduled the course "Fundamentals of Vibration Screening and Related Subjects" at several locations in October and November. The course will cover dynamic measurements in the field and the test lab, highly accelerated life testing (HALT), environmental stress screening (ESS), and highly accelerated stress screening (HASS). www.equipment-reliability.com.

AOI and boundary scan join together

Goepel Electronic (Jena, Germany; www.goepel.com) has combined automated optical inspection (AOI) and boundary-scan test technologies in its OptiCon in-line production systems. The systems can test hidden solder joints on complex components such as BGAs. A universal contactor connects power supplies and the JTAG bus to the unit under test (UUT). In addition, a programmable power supply monitors the UUT's power consumption during testing to detect any shorts and avoid invalid results.

Board-test workshop scheduled

The Board Test Action Group (BTAG) will present a two-day board-test workshop, including tutorials and technical sessions, at this year's International Test Conference (September 28–October 3, Charlotte, NC). Topics will include onboard flash programming, test strategies for multiboard systems, and boundary scan. Dan Henes of Celestica will present the keynote address on Thursday, October 2. www.itctestweek.org.

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