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Flash offers test and programming choices

Rick Nelson, Executive Editor -- Test & Measurement World, 10/1/2003

Flash memory is hot. The Semiconductor Industry Association (www.semichips.org) expects the flash market to grow 25%, to $12.1 billion, in 2004, in contrast to a 16.8% rate for the semiconductor industry as a whole.

Credence Systems (www.credence.com) cites such figures as impetus for its recent introduction of the Personal Kalos 2, which supports effective data rates to 400 MHz to speed up test. Other tester companies are similarly targeting NVMs, with Agilent Technologies (www.agilent.com) having introduced a version of its Versatest system that can test 32 NAND or 64 serial flash devices in parallel.

The RoadRunner programs flash devices as they're fed to a pick-and-place machine. Courtesy of Data I/O.

Test is only part of the picture in the life of an NVM. Many such devices must store program data. Test might seem like the ideal stage to install such code—the test process involves writing and reading data, so why not complete the test process by writing the code the DUT will ultimately store? Unfortunately, that would defeat an advantage NVM has with respect to mask ROM. With NVM, a designer needn't commit to a code version until the last minute. And with NVM, manufacturers needn't maintain inventories of multiple types of preprogrammed devices.

Consequently, various schemes have emerged to move device programming toward the end of the end-product manufacturing process. In-line programmers such as the RoadRunner from Data I/O (www.data-io.com) program devices as they're fed to a pick-and-place machine. The IEEE 1532 standard enables programming even later, allowing in-system programming via a boundary-scan port of flash devices soldered to a board.

No scheme is a panacea, however. In-line programming can make production vulnerable to inline-programmer failures, and William White, president of BP Microsystems (www.bpmicro.com) points out that in-system programming can be a time-consuming task for an expensive in-circuit tester. Two seconds of programming on an Agilent 3070 might be tolerable, he says, but 30 s probably wouldn't be. His company makes off-line programmers that buffer programming from production. Often, he says, product manufacturers will contract with a dedicated programming center or distributor to deliver programmed parts a day or so in advance of when they're needed.

Off-line programming will maintain its key role, but other approaches will make inroads. Intellitech (www.intellitech.com), for example, has introduced its PT100 tester (see p.47), which president C.J. Clark says will increase throughput for in-system programming. As competing techniques emerge, successful product engineers will need to juggle various methods, perhaps employing off-line programmers to load large operating systems while using testers to top off flash devices with product differentiators such as vendor logos and custom ring tones.

Rick Nelson, Executive Editor, rnelson@tmworld.com

 

ChipMD introduces first product

EDA startup ChipMD has announced its first software product, DesignMD, for mixed-signal circuits and memories. The company says customers have reported up to 20% increase in parametric yield and 50% increase in performance. The $50,000 (starting price) software uses standard Spice circuit simulator netlists as the input; its output is the same netlist with optimized device sizing. www.chipmd.com.

STATS installs 100th Catalyst

ST Assembly Test Services Ltd. (STATS) announced it has installed its 100th Teradyne Catalyst test platform. STATS also said that Semiconductor Manufacturing International Corp. (SMIC) of China has selected STATS to offer wafer-probe services and to provide access to test platforms including Teradyne Catalyst, Teradyne J750, and Agilent 93000 to support SMIC's mixed-signal test needs. STATS will also provide SMIC with test-engineering support from STATS's new facility in Pudong, Shanghai, set to open this month. www.statsus.com.

ICs serve high-speed instruments

Inphi has announced eight ICs for broadband test and measurement applications. These 13- to 50-GHz logic devices perform functions such as clock distribution and retiming in instruments such as Agilent Technologies' new 13.5-Gbits/s ParBERT (parallel bit-error-rate tester), which employs Inphi's new 1:4 clock fanout device. Other new devices include a 2:1 selector, double edge-triggered D flip-flop, a clock doubler, and a divide-by-8, modulo-8 counter. www.inphi-corp.com.

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