Scanning electron microscope option
Staff -- Test & Measurement World, 2/1/2004
Extended variable pressure (XVP) technology is now available for the EVO family of scanning electron microscopes (SEMs). XVP brings the ability to image hydrated, insulating, and outgassing specimens to the SEMs, allowing you to image in either water vapor or air at pressures from 1 Pa to 750 Pa. LEO Electron Microscopy, Thornwood, NY. 914-747-7700; www.leo-usa.com .
