Memory tester
Staff -- Test & Measurement World, 2/1/2004
Leveraging fast, powerful parallel test capabilities, the T5377 tests up to 256 memory devices simultaneously at speeds of 143 MHz or 286 MHz for double-data-rate memories. What's more, the system is flexible enough to perform both front-end and back-end flash memory test and employs a new system architecture to improve failure identification. Advantest, Santa Clara, CA. 408-988-7700; www.advantest.com.
