Software extends semiconductor characterization capabilities

Keithley's Model 4200-SCS semiconductor-characterization system is now available with Keithley Test Environment-Interactive (KTEI) v5.0 software. With KTEI 5.0 installed in the Model 4200-SCS, users will have the industry's only standard test system for running not only semiconductor characterization tests but also stress-measurement and reliability tests for device lifetime analysis and quality assurance. The new software brings point-and-click simplicity to current-voltage measurements of devices such as transistors, resistors, and dielectrics on up to eight independent channels.

Running in either Windows NT or XP environments, KTEI 5.0 provides the test-definition, parameter-analysis, graphing, and automation capabilities required for semiconductor characterization and reliability testing. In addition to core performance enhancements, KTEI 5.0 incorporates stress-measurement capabilities to enable a variety of reliability tests. Sample tests provided with this software release include Hot Carrier Injection (HCI), Negative Bias Temperature Instability (NBTI), Time Dependent Dielectric Breakdown (TDDB), and Electro-Migration (EM). KTEI 5.0 also allows easy incorporation of user-coded test modules for complete test customization.

To preserve a customer's investment in test programming, KTEI 5.0 software can be user-installed on any existing Model 4200-SCS with no loss of data; the installation requires no changes to the hardware or network connectivity. It is backward compatible, making it possible to run any test or program from a previous software version.

Price: $2995 for a customer-installable KTEI 5.0 upgrade; $7995 for a factory installed full system upgrade, including processor and Windows XP operating system; from $29,200 for a new 4200-SCS system with KTEI 5.0. Keithley Instruments, Cleveland, OH. 888-534-8453; www.keithley.com.