Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe
Email
Print
Reprint
Learn RSS

Complex cascades and plectics

Brad Thompson, Contributing Technical Editor -- Test & Measurement World, 2/1/2004

I should have known better. When my 1993 Pontiac TranSport van suffered a burned-out side marker lamp, I figured I'd replace the lamp in a few minutes. After all, I own a reasonably comprehensive toolkit and a shop manual for the van.

Instead, I spent almost two hours outdoors on a chilly winter afternoon dealing with a complex cascade of problems. For starters, the shop manual's illustrations and lamp-replacement procedure didn't match the actual hardware. To change the lamp, I had to displace the windshield washer tank and a headlight cluster and remove two hex nuts, one cleverly hidden in a fender pocket behind the van's battery and barely reachable with a long, thin wrench. Otherwise, to reach the offending nut, I would have had to remove a structural brace and then the battery.

Complex cascades run in two directions: In a forward cascade, a simple failure causes a branching series of events that spread unpredictably. For example, in August 2003, a couple of errant tree branches contacted high-voltage power lines, triggering a series of interlocking events and further failures that brought down the northeast's electrical grid (Ref. 1, 2).

In an inverse cascade, events in seemingly unrelated parts of a system unexpectedly interact and cause a failure. Everyone who uses a PC has encountered inexplicable operating-system glitches, many of which we can blame on cascade failures of untested combinations of programs, library routines, and device drivers.

Future automobiles will contain dozens of microprocessor-based accessories and controls, all interacting over data buses and capable of generating inverse-cascade failures. And can designers guarantee that a next-generation, 500-million gate-equivalent device or its test program will not include complex-cascade failures?

Untangling complexity cascades can consume a lot of test engineering time, and physicist Dr. Murray Gell-Mann has proposed a new branch of study called "Plectics" to explore simple and complex interactive and adaptive systems. If we're smart and lucky, Plectics will help us learn to predict— and test for— potential cascade failures. If not, our ever-more complex society can expect some interesting times.

Brad Thompson, Contributing Technical Editor, brad@tmworld.com


References
  1. The Cleveland Plain Dealer, Cleveland, OH. www.ohiocitizen.org/campaigns/electric/2003/shorted.htm.
  2. Post-Gazette.com, Pittsburgh, PA. www.pittsburghfirst.com/pg/03324/241737.stm
 

What They're Doing

For more information on Plectics, visit Dr. Murray Gell-Mann's home page, www.santafe.edu/sfi/People/mgm/.

To view a briefing on evolving challenges in deep submicron IC testing and design, go to bwrc.eecs.berkeley.edu/People/Faculty/jan/presentations/Lausanne/lecture1.pdf.

Explore issues surrounding design and testing of 100-million gate (1-billion transistor) ICs at www.eetimes.com/design_library/da/soc/OEG20021219S0031.

To probe the growing complexity of future automobile designs, go to www.planetanalog.com/design_library/ad/c/OEG20030129S0059.

What They're Saying

"Emergence is what happens when the whole is smarter than the sum of its parts. It's what happens when you have a system of relatively simple-minded component parts—often there are thousands or millions of them—and they interact in relatively simple ways."—Steven Johnson as quoted by David Sims and Rael Dornfest at www.oreillynet.com/pub/a/network/2002/02/22/johnson.html. Johnson is the author of Emergence: The Connected Lives of Ants, Brains, Cities, and Software, Scribner, 2002.

Additional Reading

For an overview of issues involving complexity in science and technology, read The Third Culture, edited by John Brockman, Simon & Schuster, 1995.

For a table of contents and a review of the book, go to www.rbjones.com/rbjpub/philos/bibliog/brockm95.htm .

Email
Print
Reprint
Learn RSS

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

Sponsored Links



 
Advertisement
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Rick Nelson
    TAKING THE MEASURE

    July 1, 2008
    S-parameters are so yesterday
    Textbook amplifiers operate in linear mode and are easy to analyze. Unfortunately, it’s often ...
    More
  • Martin Rowe
    Rowe's and Columns

    May 28, 2008
    More on Bill and Dave
    In my January 11 posting, "Tell your Bill and Dave Stories," I asked if the HP Way still e...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS
Click on a title below to learn more.

Test Industry News (3 Times Per Month)
Machine-Vision & Inspection (Monthly)
Communications Test (Monthly)
Design, Test & Yield (Monthly)
Automotive, Aerospace & Defense (Monthly)
Instrumentation (Monthly)
Resource Center E-Alert (Monthly)
©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites