Failure-analysis system
Staff -- Test & Measurement World, 5/1/2004
The nanome|x high-powered nanofocus 4-in-1 failure analysis system performs sophisticated nondestructive testing and resolves minute details. The nanofocus x-ray tube can operate in four modes covering the whole range from nanometer resolution to high-power radiation. With this tool, users can find tiny defects such as pad-wetting failures in flip-chip solder joints or cracks in bond wires. A power capability up to 50 W permits users to see through highly absorbent materials, such as tungsten alloys used in IC packages.
The nanome|x x-ray system can achieve magnifications up to 2000x, and its tube and detector can rotate up to 70° around the sample, providing the oblique view necessary for seeing minute defects in small solder joints. phoenix|x-ray Systems + Services, Camarillo, CA. 805-389-0911; www.microfocus-x-ray.com .
