System shows promise for E- and M-field measurements
Staff -- Test & Measurement World, 9/1/2004
During this year's IEEE EMC Symposium (August 9–13; Santa Clara, CA), interest in component-level EMC was reflected on the exhibit floor, where Taiyo Yuden, a Japanese manufacturer of surface-mount passive components, demonstrated a prototype measurement system for electric and magnetic fields. The system, not yet commercially available, uses a unique probe to make simultaneous measurements of the fields with a resolution of 1 mm at frequencies as great as 6 GHz.
The inventor of the probe, Dr. Satoshi Kazama, indicated that the method is being refined to provide a wider frequency range and a finer resolution, potentially allowing developers to see fields from individual leads on the IC.
The signal frequency, magnitude, and phase for both fields are captured and displayed using an x-y scanning of the device under test. Completing a 1-mm-step scan of a typical 32x32-mm IC requires about 15 min. Circuit boards take proportionally longer.
While this system is not yet a commercial product, Taiyo Yuden is using it in its own designs of Bluetooth and power modules as well as offering scanning services to its customers. www.t-yuden.com.
