Show Highlights
Staff -- Test & Measurement World, 10/1/2004
EMC symposium emphasizes test
IEEE International Symposium on Electromagnetic Compatibility, August 9–13, Santa Clara, CA, www.emc2004.org.
Taiyo Yuden (www.t-yuden.com), a Japanese manufacturer of surface-mount passive components, demonstrated a prototype measurement system that uses a unique probe to make simultaneous measurements of electric and magnetic fields with a resolution of 1 mm at frequencies as great as 6 GHz. The inventor of the probe, Dr. Satoshi Kazama, indicated that the method is being refined to provide a wider frequency range and a finer resolution, potentially allowing developers to see fields from individual leads on an IC. The signal frequency, magnitude, and phase for both fields are captured and displayed based on an x-y scan of the device under test. Completing a 1-mm step scan of a 32x32-mm IC requires about 15 min. Circuit boards take proportionally longer. While this system is not yet a commercial product, Taiyo Yuden is using it on its own designs of Bluetooth and power modules as well as offering scanning services to its customers.
Two other manufacturers also displayed similar systems. Detectus (www.detectus.se) demonstrated an x-y scanner that uses a spectrum analyzer and a near-field electromagnetic (EM) probe to look for radiation from components and devices. It also has a temperature probe option, allowing the scanner to be used for locating hot spots as well as EM radiation....The Emscan IV from Emscan (www.emscan.com) offers a magnetic-field scanning system that uses a grid of tiny H-field probes instead of a mechanical x-y scanner. This grid allows the device to make its measurements by electronically switching the probes, completing the entire scan in less than a minute.
ETS Lindgren (www.ets-lindgren.com) demonstrated its HI-6105 E-field probe, which uses a fiber-optic link for data communications and power transmission. The probe converts laser optical power to electrical energy for running the probe, eliminating the need for batteries without adding wires that could perturb the test environment. The probe connects to a PC's USB port....Rohde & Schwarz (www.rohde-schwarz.com) highlighted the ESCI EMI test receiver, which combines a test receiver and spectrum analyzer in one package and meets CISPR 16-6-6 EMC standards. The device's internal signal processing is fast enough to display both functions simultaneously....AR Worldwide (www.ar-worldwide.com) introduced a series of solid-state power amplifiers to replace traveling-wave tubes in many applications. The Models 500A250 and 1000A250 amplifiers cover the 100-kHz to 250-MHz range, supplying 500 W and 1000 W, respectively. The Model 10S4G11 is a 10-W amplifier, but with a range from 4 to 10.6 GHz.
TDK (www.tdkrfsolutions.com) has introduced a shielded video camera and support software for remote visual monitoring during EMC testing in a shielded room. The software can trigger data capture equipment based on visible changes in the device under test, including changes in meter indications, component color, and noise or distortions on display panels....Agilent Technologies (www.agilent.com) has added three detectors to its PSA Series high-performance spectrum analyzers for performing electromagnetic interference (EMI) precompliance measurements on devices. The peak, average, and quasi-peak detectors and bandwidths are now standard on all PSA models.
Loads of new products at NIWeek
NIWeek, August 16–20, Austin, TX, www.niweek.com.
Show sponsor National Instruments (www.ni.com) introduced a variety of products, including SignalExpress, which lets you quickly acquire signals without programming. NI also introduced its M Series of PCI and PXI data-acquisition cards, which improve performance over the E series through increased channel counts and finer resolution. In addition, the company unveiled its CompactRIO embedded control and acquisition platform, which adapts the firm's reconfigurable I/O (RIO) technology for applications where small size and reliability are crucial.
Asset InterTech (www.asset-intertech.com) announced a new application programming interface (API) for its ScanWorks boundary-scan software. LabView VIs let you use ScanWorks from within LabView or TestStand.....Maplesoft demonstrated Maple 9.5 computational software, which includes a set of LabView VIs. (www.maplesoft.com/ni)....Solance Technologies (www.solancetechnologies.com), demonstrated Corona, which now has a LabView interface for calibrating National Instruments instrument cards....Magma (www.magma.com) displayed PCI-bus expansion chassis that connect to laptop PCs through a CardBus interface. The chassis range in size from one slot to 13 slots....Ascor (www.ascor-inc.com) showed its Model 7205 PXI block-down converter, which extends the range of PXI signal analyzers by shifting the 4.9-GHz to 6-GHz range down to a range of 1.1 GHz to 2.2 GHz.
















