Open-architecture carrier module adapts PXI instruments for IC test

Many low-cost PXI-based instrument cards—including programmable power supplies, arbitrary waveform generators (AWGs), digitizers (DGTs), and RF signal generators—offer adequate electrical performance for high-speed semiconductor test. A carrier module can now adapt such instruments for IC test applications.

Specifically, the new carrier module, conforming to the Semiconductor Test Consortium's OpenStar specification, serves as an adapter for non-OpenStar-compliant instrument cards, enabling PXI modules to reside within the test head of an OpenStar-certified Advantest T2000 test system. The carrier module itself contains both the necessary circuitry and a plug-in submodule—called an application interface adapter (AIA)—that serves as an interface between the PXI instrument cards and the test-head interface connector. In addition, the AIA provides access from the instrument cards to tester-calibration resources, such as a digital voltmeter (DVM). The carrier module also provides clocks, triggers, power, and a data bus for the instrument cards.

The carrier module's clock/trigger block receives synchronization signals from the test system via analog and digital sync connectors. In addition, it receives and distributes clocks needed by the PXI instrument cards and the carrier module. For example, if an instrument card requires a 10-MHz clock on its backplane, the clock/trigger block will generate and provide this 10-MHz clock based on other clocks available to it.

The figure shows a StarGen PCI bridge. With the PCI bridge in place, from the software driver point of view, a PXI instrument card appears to be plugged directly into the OpenStar system's backplane and connected to the site controller.

For more information on the operation of the AIA and software drivers and on mechanical considerations, see the full version of this article.