Semiconductor device analyzer
Staff -- Test & Measurement World, 5/1/2005
The B1500A Windows-based self-contained, expandable parametric-characterization analyzer for semiconductors integrates capacitance versus voltage (CV) and current versus voltage (IV) measurements into a single instrument. Able to handle 65-nm lithographies and beyond, the modular instrument has a 10-slot configuration that supports high-resolution, medium-power, and high-power measurement units.
The instrument supports Agilent's new EasyExpert software, which provides a top-down approach to device characterization. EasyExpert software provides a library of device tests from which the user selects based on the measurement required. After the user makes a few selections, such as identifying the technology by classification and selecting the appropriate device type, the software selects the appropriate settings, makes the measurements, analyzes the data, and displays it graphically.
A 4.2-A ground unit is included with each B1500A mainframe. A multi-frequency capacitance measurement unit is also available, as is an atto-sense and switch unit (ASU), which provides measurement resolutions of 100 aA and 500 nV.
Base price: $45,000. Available: August 2005. Agilent Technologies, www.agilent.com.
