IR cameras ride again
Jon Titus, Contributing Technical Editor -- Test & Measurement World, 5/1/2005
Buyers have already seen a steep decrease in camera prices, according to Art Stout, VP of sales and marketing at Electrophysics. By way of example, a basic IR-camera system that cost $50,000 a few years ago now sells for $25K. Prices should continue to drop, probably to about $10K over the next two years.
![]() |
| A ThermaCAM IR camera can detect energy sources as small as 15 µm on an integrated circuit. A thermocouple would act as a heat sink on such a small area, thus altering the measured temperature. Courtesy of FLIR Systems. |
To emphasize the importance of falling prices, Tom Scanlon, VP of the thermographic group at FLIR Systems, noted that most IR cameras used to include display screens, viewfinders, and so on. Removing those accessories automatically reduced costs. Labs, after all, have PCs that provide processing and display functions.
The availability of sensors that operate at room temperature also reduced the cost of IR cameras. "People can buy an IR camera with a 160x120-sensor array for between $10K and $15K," explained Scanlon. People who repair PCBs, for example, can power a board and look for parts that operate outside a known-good thermal range. Often, a thermal signature will identify a defect faster than other techniques.
The appeal of IR cameras goes beyond lower prices. Doug Malchow, an applications engineer at Sensors Unlimited, explained that new technologies open new applications. The company's latest cameras operate from 400 nm (blue) to 1700 nm (IR). That extended range lets cameras "see" both visible light and invisible IR radiation.
"Technicians often align optical fibers and waveguides," explained Malchow. "An IR camera lets the technicians see the IR signals from the fibers, but they cannot see visible reference points on the fibers or waveguides. The extended-range sensors let them see both, which means they can align precise components faster."
In addition, because silicon starts to become transparent at about 1000 to 1200 nm, failure analysts can use backside emissions from silicon wafers to locate circuit faults. Simultaneously observing visible reference points helps them relate circuit defects to physical features on the wafer.
Will the new technologies and price reductions move more IR cameras into labs and test facilities? Only time will tell. If you use an IR camera now or plan to buy one, I'd like to hear from you. jontitus@comcast.net
|



















