Memory tester debuts
Staff -- Test & Measurement World, 6/1/2005
The Model T5372 offers test speeds to 143 MHz (286 MHz in DDR mode)—double those of its predecessor, the T5371—enabling it to support increasingly high-speed devices. Its optional failure-analysis functions include Fail Bit Compress Engine (which accelerates the transmission of failure data) and Address Fail Memory (which allows dual-mode operation of partitioned failure memory).
Able to test up to 128 devices in parallel, the T5372 is available with one or two test stations, each of which features a maximum of 32 DC units and 128 programmable power sources. The T5372 also retains compatibility with the T5371 and can therefore be used with existing customer assets, including test programs and probe cards, enabling a seamless upgrade.
Advantest, www.advantest.com.
