Targeting high-throughput, multisite testing of highly integrated devices, the Fusion MX offers 40 universal instrument slots, enabling a range of configurations. Capabilities include a portfolio of mixed-signal instruments, including multiple synthesizers and digitizers as well as RF, DC, and power test options; a suite of Serdes test options offering performance to 12 Gbps; digital performance to 400 Mbps with time-measurement-per-pin capability; and a flexible memory architecture.

The MX accommodates the same test programs, instrument cards, and DUT boards as other Fusion X-Series testers, including the EX for complex, high-volume ICs such as digital-consumer and baseband-communications devices; the CX for lower pin-count, high-performance analog and mixed-signal devices; and the DX desktop SOC test system. LTX, www.ltx.com