T&MW announces 2006 award winners
At a ceremony held in conjunction with the 2006 APEX show, Test & Measurement World's editors announced the winners of the Test Engineer of the Year, Test Product of the Year, and Test of Time awards.
-- Test & Measurement World, 2/9/2006 11:16:00 AM
Test & Measurement World's editors today announced the winners of our annual test industry awards. The Best in Test, Test Product of the Year, Test of Time, and Test Engineer of the Year awards were presented during a breakfast ceremony held in conjunction with the 2006 APEX show (February 8-10, Anaheim, CA).
Publisher Russ Pratt opened the ceremony by welcoming the gathering of test engineers and industry executives. Pratt proudly explained that 2006 marks Test & Measurement World's 25th anniversary year and is the 16th time we have presented our Best in Test awards.
In a departure from previous years, this year's ceremony featured a guest speaker. James Haughey, director of economics for Reed Business Information, spoke to the gathering about economic conditions, focusing on US sales forecasts for key test end markets such as computers, telecom equipment, and automobiles. Haughey also discussed the economic environment for test equipment manufacturers, covering topics such as credit costs, inflation, and the exchange rates.
Pratt then returned to the podium to begin the award presentations. The Test Engineer of the Year award, initiated in 2004, acknowledges the special contributions that test engineers make to the electronics industry. For 2006, our editors selected six nominees and highlighted their accomplishments in our September 2005 issue; we then asked our readers to vote for the Test Engineer of the Year. The winner: Zafer Boz of STMicroelectronics in Reading, UK.
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Zafer Boz |
As part of his award, Boz has been invited to designate an engineering program to receive a $20,000 grant, courtesy of National Instruments, the award sponsor. In addition, Boz will be the subject of the March cover story of Test & Measurement World. Upon receiving the award, Boz spoke to the crowd to express his thanks to colleagues, his professor, and National Instruments. (Read "Boz, Keithley, NI win T&MW awards".)
| See related stories: *T&MW Awards Program *The Best in Test--2006 *The Best in Test--2005 *2005 Test Product of the Year *Archive of Past Winners |
The PXI-5922 digitizer from National Instruments came out on top in the 2006 balloting. The PXI-5922 is a single-slot PXI card that can change its resolution with the sampling rate. Eric Starkloff of NI accepted a special award plaque from Nelson.
Nelson also announced the recipient of the 2006 Test of Time award. Presented by our editors, this award recognizes a product that continues to provide state-of-the-art performance at least five years after its introduction. This year's recipient is the Keithley 2400 SourceMeter.
Introduced in 1995, the 2400 source measure unit solved measurement problems for engineers testing passive and active components including resistors, capacitors, discrete semiconductors, and laser diodes. It has been on the market and in use for more than 10 years because it combines accuracy, automation, and communications. John Newcomer, Keithley western manager, accepted the award for his company.
Test & Measurement World inaugurated the Best in Test awards program in 1991. You can learn more about the awards and previous winners at www.tmworld.com/awards.
