ScanFlex available for in-circuit testers
Staff -- Test & Measurement World, 5/1/2006
SFX-TAP(x)/FXT transceivers, members of the vendor's ScanFlex boundary-scan platform, are designed to be integrated into in-circuit testers and optionally offer two, four, six, or eight parallel, independent TAPs. In contrast to previously available ScanFlex TAP transceivers, the new models' TAP interface cards (TIC) are differentially coupled over cables as long as 2 m and operate at frequencies to 80 MHz. Relays provide galvanic isolation from the UUT. Each TAP features programmable delay compensation combined with stepwise-programmable (250-Hz/1-MHz) TCK frequencies.
Resources such as 32 voltage-programmable dynamic I/O lines, two analog I/O channels, three digital I/O lines, and trigger lines come standard. The new transceivers communicate with ScanFlex controllers via PCI, PXI, USB, FireWire, or LAN. They work with the vendor's System Cascon software and are compliant with standards such as IEEE 1149.1, IEEE 1149.4, IEEE 1149.6, IEEE 1532, and JESD71. The software automatically recognizes the transceiver by an autodetect feature.
Base price: $1500. Goepel electronic, www.goepel.com.
