Probe holder remains stable despite high or low temperatures
Staff -- Test & Measurement World, 5/1/2006
Micromanipulator offers its Model 79-8000-HCT-03 triaxial ceramic probe holder, which provides stable and uniform electrical contact over a long test time at high or low temperatures. Common semiconductor tests that use hot or cold temperatures include electromigration, metal stress, copper interconnect, oxide reliability/breakdown, hot carrier injection, mobile ion, negative bias temperature, and instability.
The ceramic probe holder is compatible with standard 7 series probe tips and is intended for use with Micromanipulator 4000, 8000, and 9000 series probe stations.
Micromanipulator, www.micromanipulator.com.
