Mixed-signal module for OpenStar system
Staff -- Test & Measurement World, 9/1/2006
The BBWGD (for Base Band Waveform Generator Digitizer) module for Advantest’s T2000 test system accommodates DC, audio, and video as well as baseband signals to address the increasing number of mixed-signal I/O channels appearing on system-on-chip devices. The 16-channel mixed-signal module, which the company says will address multisite test applications, includes 300-MHz arbitrary-waveform-generator/digitizer capability with total harmonic distortion below –80 dBc. A high-density 2-GHz pathway to the test-system load board optimizes gain/phase linearity and I/Q pair matching. The module’s eight differential 400-Msamples/s AWGs and eight differential 128-Msamples/s digitizers enable x4 DUT baseband testing per module.
A DSP-based architecture simplifies calibration and enhances I and Q channel amplitude and phase matching. The local DSP capability minimizes data transfers to central processing resources. The module permits multiple-DUT triggering to support asynchronous designs; it also supports multiple clock domains and pattern burst modes.
Base price: less than $50,000. Advantest, www.advantest.com.
