ITC: OptimalTest introduces test management software
-- Test & Measurement World, 10/25/2006 4:28:00 PM
OptimalTest has announced its new suite of software products, Test Management Solutions (TMS), a comprehensive, scalable, and universal software tool for the management of the entire integrated-circuit testing process, from pre-production to post-production.
OT-TMS addresses the challenges of test time reduction (TTR), utilization, yield, quality, and reliability, enabling measurable improvements in each of these five key areas. OT-TMS delivers seamless connectivity among the five OT-TMS modules as well as with a company's business enterprise systems. The five OT-TMS modules are:
• OT-Mgr. The heart of OT-TMS, OT-Mgr provides integrated and coherent management of the multidisciplinary facets of test operations, enabling generation of testing algorithms. OT-Mgr incorporates OT-Rules, a testing scenario language with customizable predefined rule templates.
• OT-Sim. A capability that enables the simulation of testing rules on actual test results prior to implementation in production, OT-Sim helps quantify benefits, schedule monitoring, and execute what-if scenarios.
• OT-Box. OT-Box is a real-time, universal station controller for all testers, probers, handlers, and test programs. OT-Box is process- and device-independent, supporting all levels of test parallelism. As part of OT-TMS, it executes rules that have been created and simulated, and it implements them for wafer sort and final test in real-time or offline.
• OT-Post. OT-Post reevaluates all test results to control the quality and health of all facets of testing operations. OT-Post performs cross-quality evaluations of the entire testing fleet and all device test time and yield data.
• OT-Ops. Integrating a set of centralized test operation solutions that enable operational excellence, OT-Ops supports the need for productive test management while pinpointing inefficiencies to enable prompt responses.
Nir Erez, co-founder and COO, said, "We are very gratified by the cooperation of over a dozen major semiconductor companies who shared their test data with us as we developed OT-TMS. Beta testing OT-TMS resulted in some amazing results and enthusiastic feedback, so we look forward to making a real contribution to test management with OT-TMS."
OT-TMS is applicable to all kinds of devices—SOC, logic, memory, mixed signal, RF, CMOS sensors, stacked CSPs, and mutlicore—from wafer sort to final test.
