Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe
Email
Print
Reprint
Learn RSS

Machine vision gets soft

Steve Scheiber, Technical Editor -- Test & Measurement World, 11/1/2006

E-mail

Once upon a time, selecting an inspection system meant evaluating different hardware offerings. You chose a technology, such as x-ray or AOI, and looked for a machine whose features and capabilities matched the requirements of your operation. The speed and quality of image analysis depended on the system’s attainable field of view, the x-y travel of the camera or unit under test, and the hardware’s acquisition speed.

DOWNLOAD A PDF OF THE ENTIRE MACHINE-VISION & INSPECTION TEST REPORT FOR NOVEMBER 2006

The explosion of computing power has changed this emphasis. Image-acquisition and data-transfer rates have increased dramatically. Memory and disk storage—while not free—no longer limit image quality. And the gating issue has moved from how fast you can gather data to what the system can do with data—in other words, from the hardware to the software.

All three features in this Test Report reflect this migration. In "More versatile x-ray inspection," Paul Groome talks about software that can analyze the same x-ray data as either 2-D or 3-D images. The story on phoenix|x-ray, "10 years of machine-vision software," also emphasizes the various ways that software can manipulate the same data. And the primary achievement of MVTec is an environment for developing machine-vision applications—"Automation, Its name is software."

The capabilities of computing hardware will continue their inexorable advance. Advances in technology will continue to depend more on the imagination of people finding new ways to exploit that power than on the power itself.

Contact Steve Scheiber at sscheiber@aol.com.

Email
Print
Reprint
Learn RSS

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

Sponsored Links



 
Advertisement
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Martin Rowe
    Rowe's and Columns

    July 22, 2008
    Disposable test equipment
    While visiting a company for an upcoming T&MW print article, I heard an engineer talk about high...
    More
  • Martin Rowe
    Rowe's and Columns

    July 16, 2008
    Oscilloscope frustrations
    The other day, a reader e-mailed me about his oscilloscope frustrations. "I use my oscilloscope...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS

Click on a title below to learn more.

Test Industry News (3 Times Per Month)
Machine-Vision & Inspection (Monthly)
Communications Test (Monthly)
Design, Test & Yield (Monthly)
Automotive, Aerospace & Defense (Monthly)
Instrumentation (Monthly)
Resource Center E-Alert (Monthly)
©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites