Agilent enhances SJ50 inspection system
Staff -- Test & Measurement World, 11/1/2006
The Medalist SJ50 Series 3 automated optical inspection (AOI) system from Agilent Technologies expands on the company’s SJ50 product line to help manufacturers cope with emerging technologies, such as 01005 components. The algorithms included in the system are designed to bring greater image clarity to low-contrast components, providing the end-user with better defect-analysis capabilities. Agilent says that the image clarity results in lower false-call rates and improved defect detection.
The Medalist can be deployed in a 2-D paste, pre-reflow, mixed-mode, and post-reflow environment, yet the optics head can be converted for use in inline 3-D solder paste inspection. Agilent also says that the system cuts inspection time by 50%. www.agilent.com/see/aoi.
