Global TMW:
Log In  |  Register          Free Newsletter Subscription
Subscribe

PC-based test pod serves as oscilloscope/logic analyzer

-- Test & Measurement World, 11/21/2006 7:14:00 AM

Attached to a PC through a USB port, CWAV's USBee DX test pod verifies analog voltage levels and digital logic, as well as decodes embedded bus transactions in a single, compact, easy-to-use device.

As an oscilloscope/logic analyzer, the USBee DX offers 2 analog channels and 16 digital channels with sampling rates of up to 24 Msamles/s and dual-8-bit ADCs for the ±10-V inputs. You can also click-and-drag to instantly decode embedded bus transactions, including I2C, SPI, ASYNC, CAN, low-speed and full-speed USB, I2S, SM Bus, 1-wire, and PS/2.

Additionally, the test pod functions as a 2-channel, ±10-V digital voltmeter; data logger with 16 digital and 2 analog channels; 16-channel digital signal generator; 16-channel pulse wide modulator; 16-channel frequency counter; frequency generator that produces sets of common frequencies; I2C controller; remote controller; and 16-channel pulse counter with gating control. You can create applications to control the USBee DX with the USBee Toolbuilder source code and library.

Price: $1495. CWAV, www.usbee.com.

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

There are no other articles written by this author.


Sponsored Links



 
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Martin Rowe
    Rowe's and Columns

    June 23, 2009
    Keep those legacy GPIB cards or upgrade?
    A recent discussion on the Agilent Vee e-mail user group highlights a common problem that test engin...
    More
  • Rick Nelson
    Taking the Measure

    June 15, 2009
    Design and test highlights at the microwave show
    I attended the IEEE MTT-S International Microwave Symposium last week, where I saw a variety of desi...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS

Test Industry News
Automotive, Aerospace, & Defense
Communications Test
Design, Test & Yield
Machine-Vision & Inspection
Instrumentation
Please read our Privacy Policy
©2009 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites