Rapport adopts LogicVision BIST
-- Test & Measurement World, 12/5/2006 5:11:00 AM
LogicVision has announced that Rapport, which specializes in low-cost, dynamically configurable, massively parallel chips for compute-intensive applications at low power, has adopted LogicVision’s memory BIST for next-generation Kilocore Architecture-based products.
The Rapport Kilocore devices combine hundreds or thousands of parallel processing elements in small, low-power chips that can be dynamically reconfigured in real-time for consumer-electronics, mobile-gaming, homeland-security, server, image-processing, and suitcase-supercomputing applications. LogicVision’s Embedded Memory Test provides built-in memory test for this type of device.
“LogicVision’s Memory BIST solution gives us the flexibility we need to effectively and efficiently test the different embedded memories in next-generation Rapport Kilocore Architecture devices,” said Dr. Benjamin Levine, director of chip development at Rapport. “LogicVision offers a solution that allows us to hierarchically group and test different types and sizes of memories and allows us to select the best options for testing each one. LogicVision also provides us with the tools to easily integrate their BIST solutions into our design flow with a minimum of effort.”
“As SoC design teams incorporate more embedded memories scattered throughout their device, they demand more automation and flexibility from their memory BIST solutions,” said Farhad Hayat, VP of marketing at LogicVision. "As a leader in Memory BIST solutions, we provide a streamlined flow for implementing an optimum test strategy, when dealing with hundreds of memories within a single device, which helps customers such as Rapport meet their stringent manufacturing test requirements.”
LogicVision, www.logicvision.com
Rapport, www.kilocore.com
