News Briefs

Rohde & Schwarz has introduced an option that adds a true differential measurement mode to the R&S ZVA and R&S ZVT network analyzers. The new option is aimed at precisely characterizing the nonlinear, balanced RF components that developers increasingly are designing into wireless communications equipment. The option supports fully corrected measurements using true differential signals up to 40 GHz.

In the new true differential measurement approach, two network-analyzer internal generators generate signals of identical amplitude having 0° and 180° phase offset (with phase deviation less than 1°). The network analyzer resets the amplitude and phase relation at each test point to take into account fluctuations caused by DUT input reflections. An instrument equipped with the option delivers measured differential wave quantities and mixed-mode S-parameters fully corrected of system errors.

The new option can be integrated into the instruments by means of a software update and requires no additional hardware for calibration or measurement. Users can switch quickly between the virtual differential approach traditionally used and the new true differential mode. For direct comparison of measurement results, the two methods can be applied simultaneously. www.rohde-schwarz.com.

Mosaid Technologies has agreed to sell certain assets of its System Division's automatic test equipment (ATE) business to Teradyne for $20 million. The sale was anticipated to close April 30.

The Systems Division develops memory ATE for semiconductors. Teradyne is purchasing the assets and intellectual property (IP) associated with a Mosaid tester platform and will also receive a license to certain IP associated with current ATE product lines.

“For years, we have set the standard for excellence in engineering memory test equipment, with the Mosaid name being synonymous with high-quality memory test systems,” said George Cwynar, president and CEO of Mosaid. “However, challenging business conditions within this market—coupled with our strategic emphasis on intellectual property—led to this divestiture, which marks the end of an era for Mosaid.” www.mosaid.com.

During a ceremony held February 21 in Los Angeles, CA, Test & Measurement World announced the recipients of our annual industry awards. The winners were also profiled in our March issue (www.tmworld.com/2007_03).

Publisher Russ Pratt began the proceedings by announcing that John Gmitter, lead test engineer at Harris RF Communications, had been selected the 2007 Test Engineer of the Year by a vote of T&MW's readers. Gmitter manages a team charged with developing test stations that support his company's high-volume manufacturing of tactical communications equipment; as part of his award, he designated Monroe Community College to receive a $30,000 engineering grant, courtesy of award sponsors Agilent Technologies, Keithley Instruments, and National Instruments.

Chief editor Rick Nelson next honored the manufacturers of the 12 products that had won 2007 Best in Test awards, and he announced that our readers had selected the Agilient Infiniium 80000B series oscilloscope as the Test Product of the Year. Nelson presented the award plaque to Jun Chie, marketing manager, and Mike Karin, R&S manager of the company's oscilloscope business unit.

Richard McDonell (center) accepts the Test of Time Award from Publisher Russ Pratt (left) and Rick Nelson.

The X7056 parallel optical and x-ray inspection system combines 3-D automatic x-ray inspection (AXI) with parallel top and bottom automatic optical inspection (AOI). The optical inspection rate is 4 in.2/s; the AXI rate is 1 in.2/s.

The heart of the X7056's x-ray technology is a high-performance microfocus x-ray tube, developed and produced by Viscom, that ensures a resolution of 15 µm per pixel. The company's iterative Easy3D software helps to resolve and analyze features despite complicated overlaps on printed-circuit boards (PCBs) populated on both sides.

The X7056 employs 6-Mpixel sensor technology and can be equipped with AOI cameras for simultaneous inspection of the top and bottom of a PCB. Simultaneous inspection and double-track loading result in rapid inspection and minimal handling times, according to Viscom.

The modular X7056 can be used as a combination AOI/AXI or pure AXI system. Additional features include rapid program generation with Viscom EasyPro software and the full scope of Viscom inspection algorithms. The X7056 is hardware- and software-compatible with all Viscom AOI systems. An optional Viscom Process Control (VPC) software module controls process monitoring and optimization with various filter functions.

Base price: $350,000. Viscom, www.viscom.com.

Engineers who must test systems that have both analog and digital signals can take advantage of the AWG5000 from Tektronix, an arbitrary waveform generator (AWG) that offers either four analog outputs or two analog outputs with an optional 28 digital outputs.

The analog outputs let you create distorted signals for testing systems under repeatable simulated real-world conditions. For example, you can generate analog outputs to test I/Q modulators in RF transmitters, such as those used in wireless LANs. You can generate the signals by capturing a signal with an oscilloscope and replaying it. You can also use PC software to develop the signals and then load them into the AWG, or else run the software inside the AWG using a mouse and keyboard. In addition, you can create signals with software such as Matlab or Excel.

Each model has two digital-marker channels for each analog output. You can use the marker channels to trigger analog-to-digital converters such as those in RF/IF transmitters or to trigger instruments such as oscilloscopes.

Four models are available: two 2-channel models and two 4-channel models, with variable sample rates up to 600 Msamples/s and 1.2 Gsamples/s. The two-channel models also have an option for 28 digital I/O channels that let you, for example, test digital-to-analog converters using a digital representation of a noisy signal.

Prices: $25,000 to $45,000. Tektronix, www.tektronix.com.

International Microwave Symposium, June 3–8, Honolulu, HI. Sponsored by IEEE Microwave Theory and Techniques Society (MTT-S). www.ims2007.org.

Sensors Expo, June 11–13, Rosemont, IL. Sponsored by Questex Media Group. www.sensorsexpo.com.

To learn about other conferences, courses, and calls for papers, visit www.tmworld.com/events.