Startup debuts two probe systems
By Staff -- Test & Measurement World, 4/1/2007
Targeting known-good-die (KGD) applications, SemiProbe has announced two probe systems—the semiautomatic SA-8 and fully automatic FA-4—which allow testing of diced wafers on a stretch frame at production speeds. The company also announced the M-12 300-mm manual probe system. Both automated versions use high-speed pattern recognition to obtain the x, y, z, and theta position of all singulated die on the stretch frame prior to probing. The systems can scan more than 80,000 die positions in less then four minutes; probing begins after scan.
The M-12 300-mm manual system has a rapid-release feature that allows a user to quickly and easily navigate across a wafer with a single movement, re-engage a lead screw, and make fine adjustments using micrometer dials.
Base prices: SA-8—$55,000; FA-4—$138,000; and M-12—$65,000. SemiProbe, www.semiprobe.com.
