NI highlights PXI
Report from the 2007 Design Automation Conference, June 4-8, San Diego, CA.
-- Test & Measurement World, 6/6/2007 8:12:00 AM
National Instruments made a rare appearance at DAC 2007 to highlight the role of PXI in benchtop semiconductor test. A demonstration system at the NI booth showed how PXI could be used to in the test of ICs, including digital and mixed-signal technologies.
Coupled with the LabView test development software, the system provides engineers with an alternative to tying up full production test equipment when exercising FPGA-based prototypes as well as first silicon. The system is also capable of importing test vectors from production testers for rapid evaluation of test suites. www.ni.com
